XML in automatic test system

Yu Zhang; Ai Hua Wang; Shu Juan Liang

doi:10.1109/CISP.2010.5646773

XML in automatic test system

Yu Zhang^*
, Ai Hua Wang
, Shu Juan Liang

^*Corresponding author for this work

School of Information and Electronics

Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System,including data saving and retrieving, data exchange with Matlab and Relational Database.

Original language	English
Title of host publication	Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010
Pages	4489-4492
Number of pages	4
DOIs	https://doi.org/10.1109/CISP.2010.5646773
Publication status	Published - 2010
Event	2010 3rd International Congress on Image and Signal Processing, CISP 2010 - Yantai, China Duration: 16 Oct 2010 → 18 Oct 2010

Publication series

Name	Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010
Volume	9

Conference

Conference	2010 3rd International Congress on Image and Signal Processing, CISP 2010
Country/Territory	China
City	Yantai
Period	16/10/10 → 18/10/10

Keywords

ATS
Data exchange
RDB
XML

Access to Document

10.1109/CISP.2010.5646773

Cite this

@inproceedings{571b2444d216425bb54573ca0b92188a,

title = "XML in automatic test system",

abstract = "This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System,including data saving and retrieving, data exchange with Matlab and Relational Database.",

keywords = "ATS, Data exchange, RDB, XML",

author = "Yu Zhang and Wang, \{Ai Hua\} and Liang, \{Shu Juan\}",

year = "2010",

doi = "10.1109/CISP.2010.5646773",

language = "English",

isbn = "9781424465149",

series = "Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010",

pages = "4489--4492",

booktitle = "Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010",

note = "2010 3rd International Congress on Image and Signal Processing, CISP 2010 ; Conference date: 16-10-2010 Through 18-10-2010",

}

Zhang, Y , Wang, AH & Liang, SJ 2010, XML in automatic test system. in Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010., 5646773, Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010, vol. 9, pp. 4489-4492, 2010 3rd International Congress on Image and Signal Processing, CISP 2010, Yantai, China, 16/10/10. https://doi.org/10.1109/CISP.2010.5646773

XML in automatic test system. / Zhang, Yu ; Wang, Ai Hua; Liang, Shu Juan.
Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010. 2010. p. 4489-4492 5646773 (Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010; Vol. 9).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - XML in automatic test system

AU - Zhang, Yu

AU - Wang, Ai Hua

AU - Liang, Shu Juan

PY - 2010

Y1 - 2010

N2 - This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System,including data saving and retrieving, data exchange with Matlab and Relational Database.

AB - This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System,including data saving and retrieving, data exchange with Matlab and Relational Database.

KW - ATS

KW - Data exchange

KW - RDB

KW - XML

UR - https://www.scopus.com/pages/publications/78650582660

U2 - 10.1109/CISP.2010.5646773

DO - 10.1109/CISP.2010.5646773

M3 - Conference contribution

AN - SCOPUS:78650582660

SN - 9781424465149

T3 - Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010

SP - 4489

EP - 4492

BT - Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010

T2 - 2010 3rd International Congress on Image and Signal Processing, CISP 2010

Y2 - 16 October 2010 through 18 October 2010

ER -

XML in automatic test system

Abstract

Publication series

Conference

Keywords

Access to Document

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