X-ray photoelectron spectroscopy and its applications in secondary batteries

Chuguang Yu, Defeng Lu, Fan Xu, Liyuan Zhao, Yan Chen, Meishuai Zou, Tinglu Song*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

As an important surface analysis technique based on the photoelectric effect, X-ray Photoelectron Spectroscopy (XPS) enables both qualitative and semiquantitative analysis of the elemental composition and chemical state of the solid material surface, and has thus been widely applied in secondary batteries. In this chapter, we first delve into a detailed introduction of the working principle, main functions, analytical capabilities and technical features of XPS. Following this, we outline various types of XPS spectral peaks and elucidate general principles for data analysis. Then, the preparation of diverse XPS specimens along with their packaging and transfer processes are introduced. Last but not least, we comprehensively summarize and discuss the application of XPS in secondary batteries, including the characterization of electrode material composition, charge/discharge mechanism, solid electrolyte interphase (SEI) structure, etc. Additionally, we provide examples of the insightful information acquired through XPS and demonstrate how this data aids researchers in achieving a more profound understanding of secondary batteries, which highlights the increasingly important role of XPS in the development of secondary batteries.

Original languageEnglish
Title of host publicationAdvanced Characterization Technologies for Secondary Batteries
PublisherBentham Science Publishers
Pages97-121
Number of pages25
ISBN (Electronic)9789815305425
ISBN (Print)9789815305432
DOIs
Publication statusPublished - 4 Nov 2024

Keywords

  • Electrode materials
  • Secondary batteries
  • SEI
  • Surface characterization
  • XPS

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