X-Ray Detector Based on All-Inorganic Lead-Free Cs2AgBiBr6 Perovskite Single Crystal

Hainan Zhang; Ziyan Gao; Renrong Liang; Xinran Zheng; Xiangshun Geng; Yunfei Zhao; Dan Xie; Jiawang Hong; He Tian; Yi Yang; Xueyun Wang; Tian Ling Ren

doi:10.1109/TED.2019.2903537

X-Ray Detector Based on All-Inorganic Lead-Free Cs₂AgBiBr₆ Perovskite Single Crystal

Hainan Zhang, Ziyan Gao, Renrong Liang^*, Xinran Zheng, Xiangshun Geng, Yunfei Zhao, Dan Xie, Jiawang Hong, He Tian, Yi Yang, Xueyun Wang, Tian Ling Ren

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

71 Citations (Scopus)

Abstract

In this paper, single crystals (SCs) of the Cs₂AgBiBr₆ double perovskite were grown using the method of crystallization from a supersaturated solution. It was shown that the natural crystal growth surface of the perovskite with perfect crystal quality is along the (111) plane by X-ray diffraction (XRD) and high-resolution transmission electron microscope (HRTEM) analyses. The fabricated high-sensitivity X-ray detector based on the Cs₂AgBiBr₆ SCs with vertical structure achieved detection sensitivity up to 316μ CGyair^-1 cm^-2 under bias voltage of 18 V. Furthermore, the frequency noise characteristics of the device under different posttreatment processes were systematically analyzed, which indicated that the combination of thermal annealing and isopropanol rinsing can suppress field-driven ion migration and surface conduction channel, thereby increasing the resistivity of the perovskite material and reducing the noise current of the device. Our results revealed that the Cs₂AgBiBr₆ SCs-based X-ray detector with high sensitivity and low cost has a great potential for application in manufacturing lead-free and stable radiation detection electronics in the future.

Original language	English
Article number	8675747
Pages (from-to)	2224-2229
Number of pages	6
Journal	IEEE Transactions on Electron Devices
Volume	66
Issue number	5
DOIs	https://doi.org/10.1109/TED.2019.2903537
Publication status	Published - May 2019
Externally published	Yes

Keywords

Cs AgBiBr X-ray detector
lead-free perovskite
noise characteristics
radiation detection electronics

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10.1109/TED.2019.2903537

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@article{c6a9c99209fb46c4b5298c7038b5ba38,

title = "X-Ray Detector Based on All-Inorganic Lead-Free Cs2AgBiBr6 Perovskite Single Crystal",

abstract = "In this paper, single crystals (SCs) of the Cs2AgBiBr6 double perovskite were grown using the method of crystallization from a supersaturated solution. It was shown that the natural crystal growth surface of the perovskite with perfect crystal quality is along the (111) plane by X-ray diffraction (XRD) and high-resolution transmission electron microscope (HRTEM) analyses. The fabricated high-sensitivity X-ray detector based on the Cs2AgBiBr6 SCs with vertical structure achieved detection sensitivity up to 316μ CGyair-1 cm-2 under bias voltage of 18 V. Furthermore, the frequency noise characteristics of the device under different posttreatment processes were systematically analyzed, which indicated that the combination of thermal annealing and isopropanol rinsing can suppress field-driven ion migration and surface conduction channel, thereby increasing the resistivity of the perovskite material and reducing the noise current of the device. Our results revealed that the Cs2AgBiBr6 SCs-based X-ray detector with high sensitivity and low cost has a great potential for application in manufacturing lead-free and stable radiation detection electronics in the future.",

keywords = "Cs AgBiBr X-ray detector, lead-free perovskite, noise characteristics, radiation detection electronics",

author = "Hainan Zhang and Ziyan Gao and Renrong Liang and Xinran Zheng and Xiangshun Geng and Yunfei Zhao and Dan Xie and Jiawang Hong and He Tian and Yi Yang and Xueyun Wang and Ren, \{Tian Ling\}",

note = "Publisher Copyright: {\textcopyright} 1963-2012 IEEE.",

year = "2019",

month = may,

doi = "10.1109/TED.2019.2903537",

language = "English",

volume = "66",

pages = "2224--2229",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

}

TY - JOUR

T1 - X-Ray Detector Based on All-Inorganic Lead-Free Cs2AgBiBr6 Perovskite Single Crystal

AU - Zhang, Hainan

AU - Gao, Ziyan

AU - Liang, Renrong

AU - Zheng, Xinran

AU - Geng, Xiangshun

AU - Zhao, Yunfei

AU - Xie, Dan

AU - Hong, Jiawang

AU - Tian, He

AU - Yang, Yi

AU - Wang, Xueyun

AU - Ren, Tian Ling

PY - 2019/5

Y1 - 2019/5

N2 - In this paper, single crystals (SCs) of the Cs2AgBiBr6 double perovskite were grown using the method of crystallization from a supersaturated solution. It was shown that the natural crystal growth surface of the perovskite with perfect crystal quality is along the (111) plane by X-ray diffraction (XRD) and high-resolution transmission electron microscope (HRTEM) analyses. The fabricated high-sensitivity X-ray detector based on the Cs2AgBiBr6 SCs with vertical structure achieved detection sensitivity up to 316μ CGyair-1 cm-2 under bias voltage of 18 V. Furthermore, the frequency noise characteristics of the device under different posttreatment processes were systematically analyzed, which indicated that the combination of thermal annealing and isopropanol rinsing can suppress field-driven ion migration and surface conduction channel, thereby increasing the resistivity of the perovskite material and reducing the noise current of the device. Our results revealed that the Cs2AgBiBr6 SCs-based X-ray detector with high sensitivity and low cost has a great potential for application in manufacturing lead-free and stable radiation detection electronics in the future.

AB - In this paper, single crystals (SCs) of the Cs2AgBiBr6 double perovskite were grown using the method of crystallization from a supersaturated solution. It was shown that the natural crystal growth surface of the perovskite with perfect crystal quality is along the (111) plane by X-ray diffraction (XRD) and high-resolution transmission electron microscope (HRTEM) analyses. The fabricated high-sensitivity X-ray detector based on the Cs2AgBiBr6 SCs with vertical structure achieved detection sensitivity up to 316μ CGyair-1 cm-2 under bias voltage of 18 V. Furthermore, the frequency noise characteristics of the device under different posttreatment processes were systematically analyzed, which indicated that the combination of thermal annealing and isopropanol rinsing can suppress field-driven ion migration and surface conduction channel, thereby increasing the resistivity of the perovskite material and reducing the noise current of the device. Our results revealed that the Cs2AgBiBr6 SCs-based X-ray detector with high sensitivity and low cost has a great potential for application in manufacturing lead-free and stable radiation detection electronics in the future.

KW - Cs AgBiBr X-ray detector

KW - lead-free perovskite

KW - noise characteristics

KW - radiation detection electronics

UR - https://www.scopus.com/pages/publications/85065130370

U2 - 10.1109/TED.2019.2903537

DO - 10.1109/TED.2019.2903537

M3 - Article

AN - SCOPUS:85065130370

SN - 0018-9383

VL - 66

SP - 2224

EP - 2229

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 5

M1 - 8675747

ER -

X-Ray Detector Based on All-Inorganic Lead-Free Cs₂AgBiBr₆ Perovskite Single Crystal

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Keywords

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