Abstract
Vacuum distillation (VD) was utilized to purify thallium bromide (TlBr) materials. The influences of vacuum distillation process on the properties of the wafers for TlBr detectors were reported. Firstly, thallium bromide (TlBr) was synthesized by chemical precipitation from TlNO3 and HBr, and purified by vacuum distillation at a temperature of 520~640°C. The purification efficiency and impurity concentration were evaluated by inductively coupled plasma mass spectroscopy (ICP-MS). Then one of the purified materials was chosen to grow crystals with 8 mm diameter by vertical Bridgman method. The result of ICP-MS showed that concentration of impurities decreased by an order of magnitude after vacuum distillation purification. The XRD patterns of the wafers cut from the crystals showed that the crystals were preferentially oriented in the [110] direction. The TlBr wafers had a high resistivity of 109 Ω·cm, as well as better optical properties. The wafers can be used for the preparation of TlBr detectors.
Original language | English |
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Pages (from-to) | 1-5 |
Number of pages | 5 |
Journal | Wuhan Ligong Daxue Xuebao/Journal of Wuhan University of Technology |
Volume | 33 |
Issue number | 3 |
DOIs | |
Publication status | Published - Mar 2011 |
Externally published | Yes |
Keywords
- Crystal growth
- Crystal performance
- Thallium bomide
- Vacuum distillation