Transmission electron microscopy and its applications in secondary batteries

Lixia Bao, Ruiwen Shao, Tinglu Song, Yong Yang, Fan Xu*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

Transmission electron microscopy (TEM) has been widely employed as an important technique for detecting morphology in various secondary battery applications. When integrated with diverse accessories, TEM could attain sub-angstrom level detection, cryogenic TEM (cryo-TEM), and other functionalities, which enables the observation and comprehension of the microstructure of secondary battery materials, as well as structural variations during battery charging and discharging processes. In this chapter, essential structures, main functions, and sample preparation methods of TEM are introduced. Additionally, applications of TEM in characterizing materials used in secondary batteries are discussed and summarized. The aim is to provide essential guidance for employing TEM and to facilitate its future development.

Original languageEnglish
Title of host publicationAdvanced Characterization Technologies for Secondary Batteries
PublisherBentham Science Publishers
Pages1-36
Number of pages36
ISBN (Electronic)9789815305425
ISBN (Print)9789815305432
DOIs
Publication statusPublished - 4 Nov 2024
Externally publishedYes

Keywords

  • Cryo-TEM
  • In-situ TEM
  • Sample preparation
  • Secondary battery
  • TEM

Fingerprint

Dive into the research topics of 'Transmission electron microscopy and its applications in secondary batteries'. Together they form a unique fingerprint.

Cite this