Abstract
Far-field stroboscopic scattering microscopy tracks the propagation of both fundamental and second-harmonic waves within van der Waals waveguides, allowing parameter-free determination of phase-matching conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 325-326 |
| Number of pages | 2 |
| Journal | Nature Nanotechnology |
| Volume | 20 |
| Issue number | 3 |
| DOIs |
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| Publication status | Published - Mar 2025 |
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