Toward non-default partitioning for compound feature identification in engineering design

Yifan Qie*, Nabil Anwer

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

6 Citations (Scopus)

Abstract

Geometrical operations, such as extraction, partitioning and reconstruction, are defined in ISO standards on Geometrical Product Specifications and Verification (GPS) in order to obtain ideal and non-ideal features on mechanical parts. Default partitioning enables to decompose the workpiece into independent surface portions regarding kinematic invariance classes. For both specification and verification purposes, non-default partitioning is utilized to create compound features and assist functional tolerancing in the design process. Therefore, it is essential to formalize non-default partitioning and exploit it for supporting further operations within the design activities. In this paper, after a state-of-the-art survey of partitioning and segmentation methods for both default and non-default partitioning, a non-default partitioning process is proposed from both rule-based (explicit knowledge) and data-driven (implicit knowledge) perspectives. The rule-based process addresses non-default partitioning by using Technologically and Topologically Related Surfaces (TTRS) concept while the data-driven method benefits from the recent developments brought by a convolutional neural network (CNN) on point sets. A pre-labeled dataset of mechanical parts is established in the paper for training the network. Experiments and results on CAD models are presented to illustrate the effectiveness of the proposed non-default partitioning method.

Original languageEnglish
Pages (from-to)852-857
Number of pages6
JournalProcedia CIRP
Volume100
DOIs
Publication statusPublished - 2021
Externally publishedYes
Event31st CIRP Design Conference 2021, CIRP Design 2021 - Enschede, Netherlands
Duration: 19 May 202121 May 2021

Keywords

  • Deep learning
  • ISO GPS
  • Non-default partitioning
  • Technologically
  • Topologically Related Surfaces

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