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Topological darkness revisited: A four-dimensional picture

  • Haomin Song
  • , Xie Zeng
  • , Dengxin Ji
  • , Nan Zhang
  • , Kai Liu
  • , Qiaoqiang Gan*
  • *Corresponding author for this work
  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a complete description of "topological darkness" in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO-AT 2015
PublisherOptical Society of America
ISBN (Electronic)9781557529688
DOIs
Publication statusPublished - 4 May 2015
Externally publishedYes
EventCLEO: Applications and Technology, CLEO-AT 2015 - San Jose, United States
Duration: 10 May 201515 May 2015

Publication series

NameCLEO: Applications and Technology, CLEO-AT 2015

Conference

ConferenceCLEO: Applications and Technology, CLEO-AT 2015
Country/TerritoryUnited States
CitySan Jose
Period10/05/1515/05/15

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