Time-of-flight Secondary Ion Mass Spectrometry and its applications in secondary batteries

Tinglu Song; Huaqiang Zhu; Ziqi He; Yip Sheung Yuen Wensly; Chuguang Yu; Xinyu Yang; Shunzi Jiang; Fan Xu; Xiaodong Li

doi:10.2174/9789815305425124010008

Time-of-flight Secondary Ion Mass Spectrometry and its applications in secondary batteries

Tinglu Song
, Huaqiang Zhu
, Ziqi He
, Yip Sheung Yuen Wensly
, Chuguang Yu
, Xinyu Yang
, Shunzi Jiang
, Fan Xu
, Xiaodong Li^*

^*Corresponding author for this work

School of Material Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

1 Citation (Scopus)

Abstract

In recent years, Time of Flight-Secondary Ion Mass Spectrometry (TOFSIMS) has been widely employed as a powerful surface characterization tool in secondary battery investigations. In this chapter, we introduced the essential working principle, fundamental functions, and basic components of TOF-SIMS, which hopefully could provide useful insights for potential users and readers with particular interests in TOF-SIMS measurement. Additionally, state-of-the-art practical applications and research progress of TOF-SIMS in secondary batteries, including electrode materials and electrode/electrolyte interfaces, were thoroughly reviewed and discussed.

Original language	English
Title of host publication	Advanced Characterization Technologies for Secondary Batteries
Publisher	Bentham Science Publishers
Pages	122-145
Number of pages	24
ISBN (Electronic)	9789815305425
ISBN (Print)	9789815305432
DOIs	https://doi.org/10.2174/9789815305425124010008
Publication status	Published - 4 Nov 2024

Keywords

Depth profiling
Mapping
Secondary batteries
TOF-SIMS
Three-dimensional reconstruction

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10.2174/9789815305425124010008

Cite this

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abstract = "In recent years, Time of Flight-Secondary Ion Mass Spectrometry (TOFSIMS) has been widely employed as a powerful surface characterization tool in secondary battery investigations. In this chapter, we introduced the essential working principle, fundamental functions, and basic components of TOF-SIMS, which hopefully could provide useful insights for potential users and readers with particular interests in TOF-SIMS measurement. Additionally, state-of-the-art practical applications and research progress of TOF-SIMS in secondary batteries, including electrode materials and electrode/electrolyte interfaces, were thoroughly reviewed and discussed.",

keywords = "Depth profiling, Mapping, Secondary batteries, TOF-SIMS, Three-dimensional reconstruction",

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T1 - Time-of-flight Secondary Ion Mass Spectrometry and its applications in secondary batteries

AU - Song, Tinglu

AU - Zhu, Huaqiang

AU - He, Ziqi

AU - Wensly, Yip Sheung Yuen

AU - Yu, Chuguang

AU - Yang, Xinyu

AU - Jiang, Shunzi

AU - Xu, Fan

AU - Li, Xiaodong

PY - 2024/11/4

Y1 - 2024/11/4

N2 - In recent years, Time of Flight-Secondary Ion Mass Spectrometry (TOFSIMS) has been widely employed as a powerful surface characterization tool in secondary battery investigations. In this chapter, we introduced the essential working principle, fundamental functions, and basic components of TOF-SIMS, which hopefully could provide useful insights for potential users and readers with particular interests in TOF-SIMS measurement. Additionally, state-of-the-art practical applications and research progress of TOF-SIMS in secondary batteries, including electrode materials and electrode/electrolyte interfaces, were thoroughly reviewed and discussed.

AB - In recent years, Time of Flight-Secondary Ion Mass Spectrometry (TOFSIMS) has been widely employed as a powerful surface characterization tool in secondary battery investigations. In this chapter, we introduced the essential working principle, fundamental functions, and basic components of TOF-SIMS, which hopefully could provide useful insights for potential users and readers with particular interests in TOF-SIMS measurement. Additionally, state-of-the-art practical applications and research progress of TOF-SIMS in secondary batteries, including electrode materials and electrode/electrolyte interfaces, were thoroughly reviewed and discussed.

KW - Depth profiling

KW - Mapping

KW - Secondary batteries

KW - TOF-SIMS

KW - Three-dimensional reconstruction

UR - https://www.scopus.com/pages/publications/85212014403

U2 - 10.2174/9789815305425124010008

DO - 10.2174/9789815305425124010008

M3 - Chapter

AN - SCOPUS:85212014403

SN - 9789815305432

SP - 122

EP - 145

BT - Advanced Characterization Technologies for Secondary Batteries

PB - Bentham Science Publishers

ER -

Time-of-flight Secondary Ion Mass Spectrometry and its applications in secondary batteries

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Keywords

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