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Theoretical analysis and design improvement of nonlinearity in capacitive accelerometers

  • Jiacheng Li
  • , Rui Feng*
  • , Ming Zhou
  • , Xinlian Shang
  • , Xiaoyi Wang
  • , Huikai Xie*
  • *Corresponding author for this work
  • Beijing Institute of Technology
  • China North Industries Group Corporation No 214 Research Institute
  • Ministry of Education in China

Research output: Contribution to journalArticlepeer-review

Abstract

This paper systematically conducts theoretical analysis, structural improvement design, finite element simulation verification, and mathematical compensation model research focusing on the nonlinear characteristics of capacitive comb-drive accelerometers. First, the structural design and fabrication process of the accelerometer are presented. Then, the generation mechanism of nonlinear errors is theoretically analyzed from three dimensions: structural design, fabrication error, and testing. Research results show that: the mass bias displacement, unilateral deformation of the substrate, and installation errors significantly increase the sensitivity asymmetry of the accelerometer, further leading to the deterioration of nonlinearity. This paper proposes a single-anchor layout design with parallel arrangement in the sensing direction. Finite element simulation confirms that the nonlinearity of the improved accelerometer caused by mass bias displacement is reduced by 96.36 %; under the same substrate bending amount, the nonlinearity of the improved accelerometer is reduced by 34.72 %. To address the installation error issue, a corresponding mathematical compensation model is constructed. Within the operating range of comb finger gap variation of ±7 %, the nonlinearity of the compensated open-loop accelerometer is reduced by 67.11 %, which can be stably controlled below 900 ppm.

Original languageEnglish
Article number117480
JournalSensors and Actuators A: Physical
Volume400
DOIs
Publication statusPublished - 1 Apr 2026
Externally publishedYes

Keywords

  • Accelerometer
  • MEMS
  • Nonlinearity
  • Sensitivity asymmetry

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