The tunable dielectric properties of sputtered yttrium oxide films

Pei Lei*, Xiaoting Chen, Yue Yan, Jiaqi Zhu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Yttrium oxide film is an important dielectric material, which has been widely used in the scientific and engineering fields. The microstructures of yttrium oxide films can be modified effectively by adjusting the substrate temperature and bias voltage, which also have effects on dielectric properties of yttrium oxide films. In this work, the dielectric properties of yttrium oxide films grown on Pt film, which exhibit the distinct microstructures with cubic-phase and monoclinic-phase domination manipulated by different substrate temperatures and bias voltages, have been investigated systematically. High substrate temperature as well as large bias voltage can decrease the loss tangent and enhance the dielectric constants up to 56 and 40, respectively. Furthermore, the driven force of temperature is more favorable than that of bias voltage for enhanced dielectric constant due to fewer defects.

Original languageEnglish
Article number99
JournalApplied Physics A: Materials Science and Processing
Volume127
Issue number2
DOIs
Publication statusPublished - Feb 2021
Externally publishedYes

Keywords

  • Dielectric constants
  • MIM
  • Magnetron sputtering
  • Yttrium oxide film

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