Abstract
We studied the photoluminescence (PL) and structural properties of Ce and Yb co-doped silicon oxide films after high temperature annealing. The PL spectra of Ce3+ and Yb3+ ions were sensitive to the structural variation of the films, and the Yb PL intensities were significantly enhanced especially upon 1200 °C annealing. X-ray diffraction, transmission electron microscopy, and X-ray photoelectron spectroscopy, indicated that rare earth silicates and the CeO2 phase had formed in the oxides. The proportions of the phases varied with the "nominal Si-richness" of the films. Energy transfer from the excited Ce3+ to Yb3+ can be inferred from both PL excitation and decay spectra.
| Original language | English |
|---|---|
| Article number | 043101 |
| Journal | Journal of Applied Physics |
| Volume | 117 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 28 Jan 2015 |
| Externally published | Yes |
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