The method of residual stress gradient measurement based on ultrasonic technology

Qinxue Pan, Yanfei Ren, Yuan Wei, Yu Mi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

According to the theory of elasticity, this paper proposes a new method to measure the residual stress of components based on the critical refraction longitudinal wave (LCR). The expression model of stress in different depth layers was studied, and the residual stress gradient of different layers was detected by ultrasonic probe at different frequency, and the feasibility was verified by using a kind of C-ring experiment. The study shows that the LCR method can be used to measure the residual stress rapidly and accurately, and by changing the frequency of the ring can realize the fast detection of the stress gradient in a certain depth.

Original languageEnglish
Title of host publication2016 IEEE International Conference on Mechatronics and Automation, IEEE ICMA 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1215-1220
Number of pages6
ISBN (Electronic)9781509023943
DOIs
Publication statusPublished - 1 Sept 2016
Event13th IEEE International Conference on Mechatronics and Automation, IEEE ICMA 2016 - Harbin, Heilongjiang, China
Duration: 7 Aug 201610 Aug 2016

Publication series

Name2016 IEEE International Conference on Mechatronics and Automation, IEEE ICMA 2016

Conference

Conference13th IEEE International Conference on Mechatronics and Automation, IEEE ICMA 2016
Country/TerritoryChina
CityHarbin, Heilongjiang
Period7/08/1610/08/16

Keywords

  • Critical refraction longitudinal wave (LCR)
  • Gradient
  • Residual stress
  • Sound elasticity

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