@inproceedings{1a07e27e2af1400e91204a1f4442eeef,
title = "The finite element analysis of solder joints under temperature cycling",
abstract = "A thermal-mechanical coupled finite element analysis model of solder joints is established, which plays a role in mechanical support and electrical connection in flip chip. Periodic temperature cycle load (-45°C∼125°C) applied on the solder joints and it will generate periodic internal stress and strain in the process of the temperature cycling. With repeat using, the solder joints will produce deformation, and then cracks, extension, interlayer delaminating. The failure of the solder joints may cause the failure of the entire switch. This paper aims to simulate the periodic changes in temperature and obtain the reliability and potential failure modes of solder joints under temperature cycling, thus providing theory reference for the design and application of the novel solid MEMS switch.",
keywords = "FEM, delamination, flip-chip, solder joint, temperature cycling",
author = "Fangyi Liu and Wenzhong Lou and Fufu Wang and Xuran Ding and Dakui Wang",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014 ; Conference date: 12-08-2014 Through 15-08-2014",
year = "2014",
month = oct,
day = "13",
doi = "10.1109/ICEPT.2014.6922639",
language = "English",
series = "Proceedings of the Electronic Packaging Technology Conference, EPTC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "214--218",
editor = "Keyun Bi and Zhong Tian and Ziqiang Xu",
booktitle = "2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014",
address = "United States",
}