The effect of the interaction between the films and the substrates on the microwave properties of YBCO thin films

Shi Libin; Wang Yunfei; K. E. Yuyang; Wang Quanwu; Zhang Zhen; Zhang Guohua; Luo Sheng; Xueqiang Zhang; Chunguang Li; Hong Li; Yusheng He

doi:10.1142/s021797920704424x

The effect of the interaction between the films and the substrates on the microwave properties of YBCO thin films

Shi Libin^*
, Wang Yunfei
, K. E. Yuyang
, Wang Quanwu
, Zhang Zhen
, Zhang Guohua
, Luo Sheng
, Xueqiang Zhang
, Chunguang Li
, Hong Li
, Yusheng He

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The microwave properties of YBa₂Cu₃O _7-x/LaAlO₃ (YBCO/LAO) and YBa₂Cu ₃O_7-x/MgO (YBCO/MgO) thin films have been investigated by microstrip resonator technique. The penetration depth λ₀(0K) and the microwave surface resistance R_s can be obtained by analyzing the experimental data of the temperature dependence of resonant frequency, unload quality factor of the microstrip resonator. The stress in the two thin films can be obtained from their XRD patterns. The result shows that the stronger stress in YBCO/LAO thing film makes it have larger microwave surface resistance at lower temperature.

Original language	English
Pages (from-to)	3224-3226
Number of pages	3
Journal	International Journal of Modern Physics B
Volume	21
Issue number	18-19
DOIs	https://doi.org/10.1142/s021797920704424x
Publication status	Published - 30 Jul 2007
Externally published	Yes

Keywords

Microwave properties
Stress
YBCO/LAO thin film
YBCO/MgO thin film

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10.1142/s021797920704424x

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@article{eedbb4a8e9b74c7ab5cf44edd944920d,

title = "The effect of the interaction between the films and the substrates on the microwave properties of YBCO thin films",

abstract = "The microwave properties of YBa2Cu3O 7-x/LaAlO3 (YBCO/LAO) and YBa2Cu 3O7-x/MgO (YBCO/MgO) thin films have been investigated by microstrip resonator technique. The penetration depth λ0(0K) and the microwave surface resistance Rs can be obtained by analyzing the experimental data of the temperature dependence of resonant frequency, unload quality factor of the microstrip resonator. The stress in the two thin films can be obtained from their XRD patterns. The result shows that the stronger stress in YBCO/LAO thing film makes it have larger microwave surface resistance at lower temperature.",

keywords = "Microwave properties, Stress, YBCO/LAO thin film, YBCO/MgO thin film",

author = "Shi Libin and Wang Yunfei and Yuyang, \{K. E.\} and Wang Quanwu and Zhang Zhen and Zhang Guohua and Luo Sheng and Xueqiang Zhang and Chunguang Li and Hong Li and Yusheng He",

year = "2007",

month = jul,

day = "30",

doi = "10.1142/s021797920704424x",

language = "English",

volume = "21",

pages = "3224--3226",

journal = "International Journal of Modern Physics B",

issn = "0217-9792",

publisher = "World Scientific",

number = "18-19",

}

TY - JOUR

T1 - The effect of the interaction between the films and the substrates on the microwave properties of YBCO thin films

AU - Libin, Shi

AU - Yunfei, Wang

AU - Yuyang, K. E.

AU - Quanwu, Wang

AU - Zhen, Zhang

AU - Guohua, Zhang

AU - Sheng, Luo

AU - Zhang, Xueqiang

AU - Li, Chunguang

AU - Li, Hong

AU - He, Yusheng

PY - 2007/7/30

Y1 - 2007/7/30

N2 - The microwave properties of YBa2Cu3O 7-x/LaAlO3 (YBCO/LAO) and YBa2Cu 3O7-x/MgO (YBCO/MgO) thin films have been investigated by microstrip resonator technique. The penetration depth λ0(0K) and the microwave surface resistance Rs can be obtained by analyzing the experimental data of the temperature dependence of resonant frequency, unload quality factor of the microstrip resonator. The stress in the two thin films can be obtained from their XRD patterns. The result shows that the stronger stress in YBCO/LAO thing film makes it have larger microwave surface resistance at lower temperature.

AB - The microwave properties of YBa2Cu3O 7-x/LaAlO3 (YBCO/LAO) and YBa2Cu 3O7-x/MgO (YBCO/MgO) thin films have been investigated by microstrip resonator technique. The penetration depth λ0(0K) and the microwave surface resistance Rs can be obtained by analyzing the experimental data of the temperature dependence of resonant frequency, unload quality factor of the microstrip resonator. The stress in the two thin films can be obtained from their XRD patterns. The result shows that the stronger stress in YBCO/LAO thing film makes it have larger microwave surface resistance at lower temperature.

KW - Microwave properties

KW - Stress

KW - YBCO/LAO thin film

KW - YBCO/MgO thin film

UR - https://www.scopus.com/pages/publications/34548711815

U2 - 10.1142/s021797920704424x

DO - 10.1142/s021797920704424x

M3 - Article

AN - SCOPUS:34548711815

SN - 0217-9792

VL - 21

SP - 3224

EP - 3226

JO - International Journal of Modern Physics B

JF - International Journal of Modern Physics B

IS - 18-19

ER -

The effect of the interaction between the films and the substrates on the microwave properties of YBCO thin films

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Keywords

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