@inproceedings{d830ccc998a34889b8a4a9d3ce9ae793,
title = "Temporal high-pass non-uniformity correction algorithm based on grayscale mapping and hardware implementation",
abstract = "In this paper, we propose a novel scene-based non-uniformity correction algorithm for infrared image processing-temporal high-pass non-uniformity correction algorithm based on grayscale mapping (THP and GM). The main sources of non-uniformity are: (1) detector fabrication inaccuracies; (2) non-linearity and variations in the read-out electronics and (3) optical path effects. The non-uniformity will be reduced by non-uniformity correction (NUC) algorithms. The NUC algorithms are often divided into calibration-based non-uniformity correction (CBNUC) algorithms and scene-based non-uniformity correction (SBNUC) algorithms. As non-uniformity drifts temporally, CBNUC algorithms must be repeated by inserting a uniform radiation source which SBNUC algorithms do not need into the view, so the SBNUC algorithm becomes an essential part of infrared imaging system. The SBNUC algorithms{\texttrademark} poor robustness often leads two defects: artifacts and over-correction, meanwhile due to complicated calculation process and large storage consumption, hardware implementation of the SBNUC algorithms is difficult, especially in Field Programmable Gate Array (FPGA) platform. The THP and GM algorithm proposed in this paper can eliminate the non-uniformity without causing defects. The hardware implementation of the algorithm only based on FPGA has two advantages: (1) low resources consumption, and (2) small hardware delay: less than 20 lines, it can be transplanted to a variety of infrared detectors equipped with FPGA image processing module, it can reduce the stripe non-uniformity and the ripple non-uniformity.",
keywords = "FPGA, infrared image processing, low resources consumption, scene-based non-uniformity correction, small hardware delay, temporal high-pass",
author = "Minglei Jin and Weiqi Jin and Yiyang Li and Shuo Li",
note = "Publisher Copyright: {\textcopyright} 2015 SPIE.; 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, OIT 2015 ; Conference date: 17-05-2015 Through 19-05-2015",
year = "2015",
doi = "10.1117/12.2191836",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Guangming Shi and Bormin Huang and Xuelong Li",
booktitle = "2015 International Conference on Optical Instruments and Technology",
address = "United States",
}