Surface error consistency coefficient based on cross-correlation for evaluating the consistency of surface error measurement methods

Qun Hao*, Xin Tao, Yao Hu, Yueyue Zuo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Accuracy and correctness are significant to the entire measurement. The measurement results of new methods are usually compared with the results of mature measurement methods aiming at evaluating the consistency of the two methods, which can estimate the feasibility of new methods. Two criteria are usually utilized to evaluate the consistency of surface measurements. One criterion is to compare the Peak-Valley (PV) value and Root-Mean-Square (RMS) value directly. However, lots of surfaces which are not similar or even completely different share the same PV and RMS values. The other criterion is to analyze the point-to-point difference. But this criterion still utilizes the PV value and RMS value as the consistency evaluation of the point-to-point difference. Surface Error Consistency Coefficient (SECC) is proposed as a criterion in this paper. In this criterion, the principle of cross-correlation is introduced to evaluate the consistency of two measurement results and all the data are utilized. This criterion can evaluate the consistency of two surfaces by a percentage and is not susceptible to some special single points. In this paper, some surfaces are evaluated in simulations, and the consistency of surface maps by Coordinate-transform method and Fourier-transform method is evaluated.

Original languageEnglish
Title of host publicationAOPC 2019
Subtitle of host publicationNanophotonics
EditorsZhiping Zhou, Xiaocong Yuan, Daoxin Dai
PublisherSPIE
ISBN (Electronic)9781510634442
DOIs
Publication statusPublished - 2019
EventApplied Optics and Photonics China 2019: Nanophotonics, AOPC 2019 - Beijing, China
Duration: 7 Jul 20199 Jul 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11336
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Optics and Photonics China 2019: Nanophotonics, AOPC 2019
Country/TerritoryChina
CityBeijing
Period7/07/199/07/19

Keywords

  • Consistency evaluation
  • Cross-correlation analysis
  • Surface measurement

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