Abstract
The subsolidus phase relations of the Cu-Ga-N system are studied by X-ray powder diffraction. The phase relations of the binary Cu-Ga system are checked firstly. θ-CuGa2 which belongs to the tetragonal system is determined to be a stoichiometric compound and its thermal expansion is measured by temperature-dependent X-ray powder diffraction from 93 to 523 K. The linear temperature dependences of the expansion coefficients along the a- and c-axis and volume coefficients are obtained, αa = (1.97349 - 3.84678 × 10-5T) × 10-5, αc = (2.00261 - 3.96007 × 10-5T) × 10-5 and αV = (6.01498 - 3.49098 × 10-4T) × 10-5, respectively. No ternary compound is found in the Cu-Ga-N system. Cu and its alloys could have some reaction with GaN under the present experimental condition.
Original language | English |
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Pages (from-to) | 158-164 |
Number of pages | 7 |
Journal | Journal of Alloys and Compounds |
Volume | 438 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 12 Jul 2007 |
Externally published | Yes |
Keywords
- Nitride materials
- Phase diagram
- Semiconductors
- X-ray diffraction