Study the relation between band gap value and lattice constant of MgTi2O4

Yujun Shi; Jie Lian; Wei Hu; Yuxiang Liu; Ge He; Kui Jin; Haonan Song; Kai Dai; Jiaxiong Fang

doi:10.1016/j.jallcom.2019.02.261

Study the relation between band gap value and lattice constant of MgTi₂O₄

Yujun Shi
, Jie Lian^*
, Wei Hu
, Yuxiang Liu
, Ge He
, Kui Jin
, Haonan Song
, Kai Dai
, Jiaxiong Fang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

As an accurate technique, spectroscopic ellipsometry (SE) is utilized to study the dielectric function (ε = ε_r + iε_i) of spinel oxide MgTi₂O₄ (MTO) thin films with good orientation. C-axis lattice length and Ti ions valence state are characterized by X-ray diffraction and X-ray photoelectron spectroscopy, respectively. Here, we find that c-axis lattice constants have the positive correlation with band gaps which are obtained by fitting the spectra of d²(E²ε_i)/dE² via standard critical points model in MTO, and this phenomenon can be revealed by the Ti ions valence state. Moreover, the band gap value of MTO measured by experiment is consistent with the result of first-principles calculations.

Original language	English
Pages (from-to)	891-896
Number of pages	6
Journal	Journal of Alloys and Compounds
Volume	788
DOIs	https://doi.org/10.1016/j.jallcom.2019.02.261
Publication status	Published - 5 Jun 2019
Externally published	Yes

Keywords

Band gap
MgTiO
Optical constants
Spectroscopic ellipsometry

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10.1016/j.jallcom.2019.02.261

Cite this

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title = "Study the relation between band gap value and lattice constant of MgTi2O4",

abstract = "As an accurate technique, spectroscopic ellipsometry (SE) is utilized to study the dielectric function (ε = εr + iεi) of spinel oxide MgTi2O4 (MTO) thin films with good orientation. C-axis lattice length and Ti ions valence state are characterized by X-ray diffraction and X-ray photoelectron spectroscopy, respectively. Here, we find that c-axis lattice constants have the positive correlation with band gaps which are obtained by fitting the spectra of d2(E2εi)/dE2 via standard critical points model in MTO, and this phenomenon can be revealed by the Ti ions valence state. Moreover, the band gap value of MTO measured by experiment is consistent with the result of first-principles calculations.",

keywords = "Band gap, MgTiO, Optical constants, Spectroscopic ellipsometry",

author = "Yujun Shi and Jie Lian and Wei Hu and Yuxiang Liu and Ge He and Kui Jin and Haonan Song and Kai Dai and Jiaxiong Fang",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier B.V.",

year = "2019",

month = jun,

day = "5",

doi = "10.1016/j.jallcom.2019.02.261",

language = "English",

volume = "788",

pages = "891--896",

journal = "Journal of Alloys and Compounds",

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TY - JOUR

T1 - Study the relation between band gap value and lattice constant of MgTi2O4

AU - Shi, Yujun

AU - Lian, Jie

AU - Hu, Wei

AU - Liu, Yuxiang

AU - He, Ge

AU - Jin, Kui

AU - Song, Haonan

AU - Dai, Kai

AU - Fang, Jiaxiong

PY - 2019/6/5

Y1 - 2019/6/5

N2 - As an accurate technique, spectroscopic ellipsometry (SE) is utilized to study the dielectric function (ε = εr + iεi) of spinel oxide MgTi2O4 (MTO) thin films with good orientation. C-axis lattice length and Ti ions valence state are characterized by X-ray diffraction and X-ray photoelectron spectroscopy, respectively. Here, we find that c-axis lattice constants have the positive correlation with band gaps which are obtained by fitting the spectra of d2(E2εi)/dE2 via standard critical points model in MTO, and this phenomenon can be revealed by the Ti ions valence state. Moreover, the band gap value of MTO measured by experiment is consistent with the result of first-principles calculations.

AB - As an accurate technique, spectroscopic ellipsometry (SE) is utilized to study the dielectric function (ε = εr + iεi) of spinel oxide MgTi2O4 (MTO) thin films with good orientation. C-axis lattice length and Ti ions valence state are characterized by X-ray diffraction and X-ray photoelectron spectroscopy, respectively. Here, we find that c-axis lattice constants have the positive correlation with band gaps which are obtained by fitting the spectra of d2(E2εi)/dE2 via standard critical points model in MTO, and this phenomenon can be revealed by the Ti ions valence state. Moreover, the band gap value of MTO measured by experiment is consistent with the result of first-principles calculations.

KW - Band gap

KW - MgTiO

KW - Optical constants

KW - Spectroscopic ellipsometry

UR - https://www.scopus.com/pages/publications/85062283558

U2 - 10.1016/j.jallcom.2019.02.261

DO - 10.1016/j.jallcom.2019.02.261

M3 - Article

AN - SCOPUS:85062283558

SN - 0925-8388

VL - 788

SP - 891

EP - 896

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

ER -

Study the relation between band gap value and lattice constant of MgTi₂O₄

Abstract

Keywords

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