Study on failure models and degradation rate of PV aged modules in field in China

Hailing Li; Fang Lv

doi:10.1109/PVSC.2018.8547795

Study on failure models and degradation rate of PV aged modules in field in China

Hailing Li
, Fang Lv

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.

Original language	English
Title of host publication	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	727-730
Number of pages	4
ISBN (Electronic)	9781538685297
DOIs	https://doi.org/10.1109/PVSC.2018.8547795
Publication status	Published - 26 Nov 2018
Externally published	Yes
Event	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States Duration: 10 Jun 2018 → 15 Jun 2018

Publication series

Name	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Conference

Conference	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
Country/Territory	United States
City	Waikoloa Village
Period	10/06/18 → 15/06/18

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Degradation
Power system reliability

Access to Document

10.1109/PVSC.2018.8547795

Cite this

Li, H., & Lv, F. (2018). Study on failure models and degradation rate of PV aged modules in field in China. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (pp. 727-730). Article 8547795 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8547795

Li, Hailing ; Lv, Fang. / Study on failure models and degradation rate of PV aged modules in field in China. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 727-730 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

@inproceedings{2b0e815c24914456a7f4b87d5fd451ab,

title = "Study on failure models and degradation rate of PV aged modules in field in China",

abstract = "This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73\%/year. No clear correlation between degradation rate and climatic zone is found.",

keywords = "Degradation, Power system reliability",

author = "Hailing Li and Fang Lv",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",

year = "2018",

month = nov,

day = "26",

doi = "10.1109/PVSC.2018.8547795",

language = "English",

series = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "727--730",

booktitle = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",

address = "United States",

}

Li, H & Lv, F 2018, Study on failure models and degradation rate of PV aged modules in field in China. in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC., 8547795, 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers Inc., pp. 727-730, 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, United States, 10/06/18. https://doi.org/10.1109/PVSC.2018.8547795

Study on failure models and degradation rate of PV aged modules in field in China. / Li, Hailing; Lv, Fang.
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. p. 727-730 8547795 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Study on failure models and degradation rate of PV aged modules in field in China

AU - Li, Hailing

AU - Lv, Fang

PY - 2018/11/26

Y1 - 2018/11/26

N2 - This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.

AB - This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in China. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.

KW - Degradation

KW - Power system reliability

UR - https://www.scopus.com/pages/publications/85059899068

U2 - 10.1109/PVSC.2018.8547795

DO - 10.1109/PVSC.2018.8547795

M3 - Conference contribution

AN - SCOPUS:85059899068

T3 - 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

SP - 727

EP - 730

BT - 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018

Y2 - 10 June 2018 through 15 June 2018

ER -

Li H, Lv F. Study on failure models and degradation rate of PV aged modules in field in China. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc. 2018. p. 727-730. 8547795. (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). doi: 10.1109/PVSC.2018.8547795

Study on failure models and degradation rate of PV aged modules in field in China

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

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