Study on damage effect and threshold of high energy 1.06μm-wavelength long-pulse laser to photo detector

Lei Tang*, Jianhua Wang, Jun Li, Qun Hao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

In this paper, the damage mechanism of high energy laser to photoelectric detector is studied. With a long pulse laser at the wavelength of 1.06μm, energy saturation threshold measurement and damage test for CCD camera and four-quadrant detector are performed separately. The test results will play important roles not only in design and development of laser but also in evaluation of operational effectiveness.

Original languageEnglish
Title of host publicationConference Proceedings - 2012 16th International Symposium on Electromagnetic Launch Technology, EML 2012
DOIs
Publication statusPublished - 2012
Event2012 16th International Symposium on Electromagnetic Launch Technology, EML 2012 - Beijing, China
Duration: 15 May 201219 May 2012

Publication series

NameConference Proceedings - 2012 16th International Symposium on Electromagnetic Launch Technology, EML 2012

Conference

Conference2012 16th International Symposium on Electromagnetic Launch Technology, EML 2012
Country/TerritoryChina
CityBeijing
Period15/05/1219/05/12

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