Study on Ag-CuO sealing materials for planer SOFC

  • Zhe Min Shen
  • , Ke Ning Sun*
  • , Yan Yan
  • , Xiao Liang Zhou
  • , Nai Qing Zhang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Ag-CuO sealing material was used to realize the sealing between the SUS430 interconnect and the NiO-YSZ anode in air. Leakage rate were tested, and SEM and EPMA tests were conducted to determine its hermeticity, compatability and thermal cycling stability. Results indicated that Ag-CuO sealing material could realize the seals between the interconnect and the anode effectively, and when the Cu content was 6mol%, the simulating leakage was smallest, and lower than 0.001mL/(min·cm).After ten times thermal cycling, the leakage rate kept stable. EPMA analyses proved that no element diffusion occured at the interconnect/Ag-CuO interface.

Original languageEnglish
Pages (from-to)1372-1375
Number of pages4
JournalGongneng Cailiao/Journal of Functional Materials
Volume42
Issue number8
Publication statusPublished - Aug 2011
Externally publishedYes

Keywords

  • Ag-CuO
  • Leakage
  • SOFC
  • Seal

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