Abstract
Ag-CuO sealing material was used to realize the sealing between the SUS430 interconnect and the NiO-YSZ anode in air. Leakage rate were tested, and SEM and EPMA tests were conducted to determine its hermeticity, compatability and thermal cycling stability. Results indicated that Ag-CuO sealing material could realize the seals between the interconnect and the anode effectively, and when the Cu content was 6mol%, the simulating leakage was smallest, and lower than 0.001mL/(min·cm).After ten times thermal cycling, the leakage rate kept stable. EPMA analyses proved that no element diffusion occured at the interconnect/Ag-CuO interface.
| Original language | English |
|---|---|
| Pages (from-to) | 1372-1375 |
| Number of pages | 4 |
| Journal | Gongneng Cailiao/Journal of Functional Materials |
| Volume | 42 |
| Issue number | 8 |
| Publication status | Published - Aug 2011 |
| Externally published | Yes |
Keywords
- Ag-CuO
- Leakage
- SOFC
- Seal
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