Study of wavefront error and polarization of a side mounted infrared window

  • Jiaguo Liu*
  • , Lin Li
  • , Xinqi Hu
  • , Xin Yu
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

The wavefront error and polarization of a side mounted infrared window made of ZnS are studied. The Infrared windows suffer from temperature gradient and stress during their launch process. Generally, the gradient in temperature changes the refractive index of the material whereas stress produces deformation and birefringence. In this paper, a thermal finite element analysis (FEA) of an IR window is presented. For this purpose, we employed an FEA program Ansys to obtain the time-varying temperature field. The deformation and stress of the window are derived from a structural FEA with the aerodynamic force and the temperature field previously obtained as being the loads. The deformation, temperature field, stress field, ray tracing and Jones Calculus are used to calculate the wavefront error and the change of polarization state.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2007
Subtitle of host publicationOptoelectronic System Design, Manufacturing, and Testing
DOIs
Publication statusPublished - 2008
EventInternational Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings - Beijing, China
Duration: 9 Sept 200712 Sept 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6624
ISSN (Print)0277-786X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings
Country/TerritoryChina
CityBeijing
Period9/09/0712/09/07

Keywords

  • Aero-optic effect
  • Birefringence
  • FEA
  • IR window
  • Ray tracing
  • Wavefront error

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