Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

B. Mangote; L. Gallais; M. Zerrad; M. Commandré; L. H. Gao; F. Lemarchand; M. Lequime; A. Melninkaitis; J. Mirauskas; V. Sirutkaitis; S. Kicas; T. Tolenis; R. Drazdys; M. Mende; L. Jensen; H. Ehlers; D. Ristau

doi:10.1117/12.897372

Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

B. Mangote, L. Gallais^*, M. Zerrad, M. Commandré, L. H. Gao, F. Lemarchand, M. Lequime, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, R. Drazdys, M. Mende, L. Jensen, H. Ehlers, D. Ristau

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Abstract

We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al₂O3, Nb₂O₅, HfO₂, SiO ₂, Ta₂O₅, ZrO₂ deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al₂O₃/SiO₂, Nb ₂O₅/SiO₂, HfO₂/SiO₂, Ta₂O₅/SiO₂ and ZrO₂/SiO₂ on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

Original language	English
Title of host publication	Advances in Optical Thin Films IV
Publisher	SPIE
ISBN (Print)	9780819487940
DOIs	https://doi.org/10.1117/12.897372
Publication status	Published - 2011
Externally published	Yes
Event	Advances in Optical Thin Films IV - Marseille, France Duration: 5 Sept 2011 → 7 Sept 2011

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8168
ISSN (Print)	0277-786X

Conference

Conference	Advances in Optical Thin Films IV
Country/Territory	France
City	Marseille
Period	5/09/11 → 7/09/11

Keywords

Laser-induced damage
Mixture coatings
Optical coatings
Oxide coatings
Sub-picosecond pulse

Access to Document

10.1117/12.897372

Cite this

Mangote, B., Gallais, L., Zerrad, M., Commandré, M., Gao, L. H., Lemarchand, F., Lequime, M., Melninkaitis, A., Mirauskas, J., Sirutkaitis, V., Kicas, S., Tolenis, T., Drazdys, R., Mende, M., Jensen, L., Ehlers, H., & Ristau, D. (2011). Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. In Advances in Optical Thin Films IV Article 1 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8168). SPIE. https://doi.org/10.1117/12.897372

@inproceedings{e959aa3e4a9946c98a0452f993870f36,

title = "Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films",

abstract = "We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.",

keywords = "Laser-induced damage, Mixture coatings, Optical coatings, Oxide coatings, Sub-picosecond pulse",

author = "B. Mangote and L. Gallais and M. Zerrad and M. Commandr{\'e} and Gao, {L. H.} and F. Lemarchand and M. Lequime and A. Melninkaitis and J. Mirauskas and V. Sirutkaitis and S. Kicas and T. Tolenis and R. Drazdys and M. Mende and L. Jensen and H. Ehlers and D. Ristau",

year = "2011",

doi = "10.1117/12.897372",

language = "English",

isbn = "9780819487940",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

booktitle = "Advances in Optical Thin Films IV",

address = "United States",

note = "Advances in Optical Thin Films IV ; Conference date: 05-09-2011 Through 07-09-2011",

}

Mangote, B, Gallais, L, Zerrad, M, Commandré, M, Gao, LH, Lemarchand, F, Lequime, M, Melninkaitis, A, Mirauskas, J, Sirutkaitis, V, Kicas, S, Tolenis, T, Drazdys, R, Mende, M, Jensen, L, Ehlers, H & Ristau, D 2011, Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. in Advances in Optical Thin Films IV., 1, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8168, SPIE, Advances in Optical Thin Films IV, Marseille, France, 5/09/11. https://doi.org/10.1117/12.897372

Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. / Mangote, B.; Gallais, L.; Zerrad, M. et al.
Advances in Optical Thin Films IV. SPIE, 2011. 1 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8168).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

AU - Mangote, B.

AU - Gallais, L.

AU - Zerrad, M.

AU - Commandré, M.

AU - Gao, L. H.

AU - Lemarchand, F.

AU - Lequime, M.

AU - Melninkaitis, A.

AU - Mirauskas, J.

AU - Sirutkaitis, V.

AU - Kicas, S.

AU - Tolenis, T.

AU - Drazdys, R.

AU - Mende, M.

AU - Jensen, L.

AU - Ehlers, H.

AU - Ristau, D.

PY - 2011

Y1 - 2011

N2 - We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

AB - We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

KW - Laser-induced damage

KW - Mixture coatings

KW - Optical coatings

KW - Oxide coatings

KW - Sub-picosecond pulse

UR - http://www.scopus.com/inward/record.url?scp=80455125882&partnerID=8YFLogxK

U2 - 10.1117/12.897372

DO - 10.1117/12.897372

M3 - Conference contribution

AN - SCOPUS:80455125882

SN - 9780819487940

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Advances in Optical Thin Films IV

PB - SPIE

T2 - Advances in Optical Thin Films IV

Y2 - 5 September 2011 through 7 September 2011

ER -

Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

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Keywords

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