Study of temperature and field dependence of ferroelectric thin films at microwave frequencies

Qingduan Meng; Xueqiang Zhang; Fei Li; Jiandong Huang; Xiaohong Zhu; Dongning Zheng; Yusheng He; Qiang Luo; Changzhi Gu

doi:10.1063/1.2355350

Study of temperature and field dependence of ferroelectric thin films at microwave frequencies

Qingduan Meng^*, Xueqiang Zhang, Fei Li, Jiandong Huang, Xiaohong Zhu, Dongning Zheng, Yusheng He, Qiang Luo, Changzhi Gu

^*Corresponding author for this work

CAS - Institute of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Ferroelectric thin films (e.g. Ba_0.5Sr_0.5TiO ₃) require systematic studies of their dielectric properties at microwave frequencies. We propose a new method employing comparisons between the measured and the simulated microwave responses of a coplanar waveguide (CPW) bandstop filter, which is made of the thin film to be studied. The temperature and field dependence of the dielectric constant and loss tangent of the ferroelectric thin film are then deduced from the systematic comparison studies. Attention is also paid to the effect of the temperature dependent conductivity of the conducting layer of the filter, which has a noticeable effect on both the resonant frequency and the Q value of the filter. For an accurate determination of the dielectric constant and loss tangent of the ferroelectric thin film, such effect should be carefully analyzed and eliminated.

Original language	English
Title of host publication	LOW TEMPERATURE PHYSICS
Subtitle of host publication	24th International Conference on Low Temperature Physics - LT24
Pages	1669-1670
Number of pages	2
DOIs	https://doi.org/10.1063/1.2355350
Publication status	Published - 2006
Externally published	Yes
Event	LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 - Orlando, FL, United States Duration: 10 Aug 2006 → 17 Oct 2006

Publication series

Name	AIP Conference Proceedings
Volume	850
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24
Country/Territory	United States
City	Orlando, FL
Period	10/08/06 → 17/10/06

Keywords

BST
CPW
Dielectric properties

Access to Document

10.1063/1.2355350

Cite this

Meng, Q., Zhang, X., Li, F., Huang, J., Zhu, X., Zheng, D., He, Y., Luo, Q., & Gu, C. (2006). Study of temperature and field dependence of ferroelectric thin films at microwave frequencies. In LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 (pp. 1669-1670). (AIP Conference Proceedings; Vol. 850). https://doi.org/10.1063/1.2355350

@inproceedings{3a1bb77af99f476ebd804ae855e55de1,

title = "Study of temperature and field dependence of ferroelectric thin films at microwave frequencies",

abstract = "Ferroelectric thin films (e.g. Ba0.5Sr0.5TiO 3) require systematic studies of their dielectric properties at microwave frequencies. We propose a new method employing comparisons between the measured and the simulated microwave responses of a coplanar waveguide (CPW) bandstop filter, which is made of the thin film to be studied. The temperature and field dependence of the dielectric constant and loss tangent of the ferroelectric thin film are then deduced from the systematic comparison studies. Attention is also paid to the effect of the temperature dependent conductivity of the conducting layer of the filter, which has a noticeable effect on both the resonant frequency and the Q value of the filter. For an accurate determination of the dielectric constant and loss tangent of the ferroelectric thin film, such effect should be carefully analyzed and eliminated.",

keywords = "BST, CPW, Dielectric properties",

author = "Qingduan Meng and Xueqiang Zhang and Fei Li and Jiandong Huang and Xiaohong Zhu and Dongning Zheng and Yusheng He and Qiang Luo and Changzhi Gu",

year = "2006",

doi = "10.1063/1.2355350",

language = "English",

isbn = "0735403473",

series = "AIP Conference Proceedings",

pages = "1669--1670",

booktitle = "LOW TEMPERATURE PHYSICS",

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}

Meng, Q, Zhang, X, Li, F, Huang, J, Zhu, X, Zheng, D, He, Y, Luo, Q & Gu, C 2006, Study of temperature and field dependence of ferroelectric thin films at microwave frequencies. in LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24. AIP Conference Proceedings, vol. 850, pp. 1669-1670, LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24, Orlando, FL, United States, 10/08/06. https://doi.org/10.1063/1.2355350

Study of temperature and field dependence of ferroelectric thin films at microwave frequencies. / Meng, Qingduan; Zhang, Xueqiang; Li, Fei et al.
LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24. 2006. p. 1669-1670 (AIP Conference Proceedings; Vol. 850).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Study of temperature and field dependence of ferroelectric thin films at microwave frequencies

AU - Meng, Qingduan

AU - Zhang, Xueqiang

AU - Li, Fei

AU - Huang, Jiandong

AU - Zhu, Xiaohong

AU - Zheng, Dongning

AU - He, Yusheng

AU - Luo, Qiang

AU - Gu, Changzhi

PY - 2006

Y1 - 2006

N2 - Ferroelectric thin films (e.g. Ba0.5Sr0.5TiO 3) require systematic studies of their dielectric properties at microwave frequencies. We propose a new method employing comparisons between the measured and the simulated microwave responses of a coplanar waveguide (CPW) bandstop filter, which is made of the thin film to be studied. The temperature and field dependence of the dielectric constant and loss tangent of the ferroelectric thin film are then deduced from the systematic comparison studies. Attention is also paid to the effect of the temperature dependent conductivity of the conducting layer of the filter, which has a noticeable effect on both the resonant frequency and the Q value of the filter. For an accurate determination of the dielectric constant and loss tangent of the ferroelectric thin film, such effect should be carefully analyzed and eliminated.

AB - Ferroelectric thin films (e.g. Ba0.5Sr0.5TiO 3) require systematic studies of their dielectric properties at microwave frequencies. We propose a new method employing comparisons between the measured and the simulated microwave responses of a coplanar waveguide (CPW) bandstop filter, which is made of the thin film to be studied. The temperature and field dependence of the dielectric constant and loss tangent of the ferroelectric thin film are then deduced from the systematic comparison studies. Attention is also paid to the effect of the temperature dependent conductivity of the conducting layer of the filter, which has a noticeable effect on both the resonant frequency and the Q value of the filter. For an accurate determination of the dielectric constant and loss tangent of the ferroelectric thin film, such effect should be carefully analyzed and eliminated.

KW - BST

KW - CPW

KW - Dielectric properties

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M3 - Conference contribution

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SN - 0735403473

SN - 9780735403475

T3 - AIP Conference Proceedings

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EP - 1670

BT - LOW TEMPERATURE PHYSICS

T2 - LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24

Y2 - 10 August 2006 through 17 October 2006

ER -

Study of temperature and field dependence of ferroelectric thin films at microwave frequencies

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