Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope

Tian Lan; Guoqiang Ni

doi:10.1115/mnc2007-21323

Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope

Tian Lan^*, Guoqiang Ni

^*Corresponding author for this work

School of Information and Electronics

Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.

Original language	English
Title of host publication	Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007
Publisher	American Society of Mechanical Engineers(ASME)
Pages	1615-1620
Number of pages	6
ISBN (Print)	0791842657, 9780791842652
DOIs	https://doi.org/10.1115/mnc2007-21323
Publication status	Published - 2007
Event	International Conference on Integration and Commercialization of Micro and Nanosystems 2007 - Sanya, Hainan, China Duration: 10 Jan 2007 → 13 Jan 2007

Publication series

Name	Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007
Volume	B

Conference

Conference	International Conference on Integration and Commercialization of Micro and Nanosystems 2007
Country/Territory	China
City	Sanya, Hainan
Period	10/01/07 → 13/01/07

Keywords

Spatio-temporal mapping
Transient measurements
Ultrafast scanning tunneling microscope (USTM)

Access to Document

10.1115/mnc2007-21323

Cite this

Lan, T., & Ni, G. (2007). Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope. In Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007 (pp. 1615-1620). (Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007; Vol. B). American Society of Mechanical Engineers(ASME). https://doi.org/10.1115/mnc2007-21323

Lan, Tian ; Ni, Guoqiang. / Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope. Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007. American Society of Mechanical Engineers(ASME), 2007. pp. 1615-1620 (Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007).

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title = "Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope",

abstract = "In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.",

keywords = "Spatio-temporal mapping, Transient measurements, Ultrafast scanning tunneling microscope (USTM)",

author = "Tian Lan and Guoqiang Ni",

year = "2007",

doi = "10.1115/mnc2007-21323",

language = "English",

isbn = "0791842657",

series = "Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007",

publisher = "American Society of Mechanical Engineers(ASME)",

pages = "1615--1620",

booktitle = "Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007",

note = "International Conference on Integration and Commercialization of Micro and Nanosystems 2007 ; Conference date: 10-01-2007 Through 13-01-2007",

}

Lan, T & Ni, G 2007, Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope. in Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007. Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007, vol. B, American Society of Mechanical Engineers(ASME), pp. 1615-1620, International Conference on Integration and Commercialization of Micro and Nanosystems 2007, Sanya, Hainan, China, 10/01/07. https://doi.org/10.1115/mnc2007-21323

Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope. / Lan, Tian; Ni, Guoqiang.
Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007. American Society of Mechanical Engineers(ASME), 2007. p. 1615-1620 (Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007; Vol. B).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope

AU - Lan, Tian

AU - Ni, Guoqiang

PY - 2007

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N2 - In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.

AB - In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.

KW - Spatio-temporal mapping

KW - Transient measurements

KW - Ultrafast scanning tunneling microscope (USTM)

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Lan T, Ni G. Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope. In Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007. American Society of Mechanical Engineers(ASME). 2007. p. 1615-1620. (Proceedings of the International Conference on Integration and Commercialization of Micro and Nanosystems 2007). doi: 10.1115/mnc2007-21323

Spatio-temporal mapping of transient electric fields with ultrafast scanning tunneling microscope

Abstract

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Keywords

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