Abstract
A deep learning (DL)-based scheme is proposed to solve electromagnetic (EM) scattering from a three-dimensional (3-D) dielectric scatterer whose profile is incomplete. As compensation, a limited amount of scattering data can be acquired. The measurement data from the Fresnel database are employed to validate the proposed scheme.
| Original language | English |
|---|---|
| Journal | IEEE International Conference on Computational Electromagnetics, ICCEM |
| Issue number | 2026 |
| DOIs | |
| Publication status | Published - 2026 |
| Externally published | Yes |
| Event | 2026 IEEE International Conference on Computational Electromagnetics, ICCEM 2026 - Shanghai, China Duration: 10 Apr 2026 → 12 Apr 2026 |
Keywords
- deep learning (DL)
- Electromagnetic (EM) scattering
- EM inverse scattering
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