Soft technology in storage testing

Shuping Yang*, Jin Zhou, Jing Zu, Hua Wang

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

It is imperative to develop an Adaptive Instantaneous Wave Micro-Recorder (AIWMR) to record instantaneous signals (please see for more details). Because testing environment is varying, a universal recorder should change its working pattern, but this change in our previous recorders always leads to the changing of hardware. So, in order to realize the AIWMR, some soft technology is explored in this region. This paper presents some rather new ideals about the soft frequency division and the multipurpose nonlinear analog-to-digital converter (ADC). The former provides a set of divided frequency without adding the complexity hardware. The latter describes the ADC with nonlinear algorithm instead of the traditional binary formula (1). The nonlinear ADC makes integrated circuits easy and, at the same time, maintains high accuracy and high speed.

Original languageEnglish
Pages239-242
Number of pages4
Publication statusPublished - 1997
Externally publishedYes
EventProceedings of the 1997 2nd International Symposium on Test and Measurement, ISTM - Beijing, China
Duration: 1 Jun 19974 Jun 1997

Conference

ConferenceProceedings of the 1997 2nd International Symposium on Test and Measurement, ISTM
CityBeijing, China
Period1/06/974/06/97

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