TY - JOUR
T1 - Sn addition on the tensile properties of high temperature Zn-4Al-3Mg solder alloys
AU - Cheng, Fangjie
AU - Gao, Feng
AU - Wang, Yan
AU - Wu, Yunlong
AU - Ma, Zhaolong
AU - Yang, Junxiang
PY - 2012/3
Y1 - 2012/3
N2 - The Zn-4Al-3Mg based solder alloy is a promising candidate to replace the conventional Pb-5Sn alloy in high-temperature electronic packaging. In this study, the tensile properties of Zn-4Al-3Mg-xSn alloys (x = 0, 6.8 and 13.2 wt.%) at high temperatures (e.g., 100 °C, and 200°C) were investigated. It was found that the uniaxial tensile strength (UTS) of Zn-4Al-3Mg-xSn solder alloys all decrease monotonously with the increment of temperature. The elongation ratio at 100°C is superior to that at room temperature whereas follows a significant drop at 200°C. The microstructure observations show that a typical brittle fracture of Zn-4Al-3Mg alloy occurs at room temperature and 200°C under normal tension, whereas a ductile fracture is found at 100°C. The 6.8 wt.% Sn addition in Zn-4Al-3Mg alloy causes a dramatic decrease of yield strength, and a slight deterioration of the ductility.
AB - The Zn-4Al-3Mg based solder alloy is a promising candidate to replace the conventional Pb-5Sn alloy in high-temperature electronic packaging. In this study, the tensile properties of Zn-4Al-3Mg-xSn alloys (x = 0, 6.8 and 13.2 wt.%) at high temperatures (e.g., 100 °C, and 200°C) were investigated. It was found that the uniaxial tensile strength (UTS) of Zn-4Al-3Mg-xSn solder alloys all decrease monotonously with the increment of temperature. The elongation ratio at 100°C is superior to that at room temperature whereas follows a significant drop at 200°C. The microstructure observations show that a typical brittle fracture of Zn-4Al-3Mg alloy occurs at room temperature and 200°C under normal tension, whereas a ductile fracture is found at 100°C. The 6.8 wt.% Sn addition in Zn-4Al-3Mg alloy causes a dramatic decrease of yield strength, and a slight deterioration of the ductility.
UR - http://www.scopus.com/inward/record.url?scp=84857372390&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2011.10.003
DO - 10.1016/j.microrel.2011.10.003
M3 - Article
AN - SCOPUS:84857372390
SN - 0026-2714
VL - 52
SP - 579
EP - 584
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 3
ER -