Self-Rectifying Resistive Switching Characteristics in CsMAFAPbIBr Perovskite-Based Memristor Device

Jia Cheng Li, Ying Chen Li, Zi Chun Liu, Yuan Xiao Ma*, Ye Liang Wang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Self-rectifying memristors have been attracting attentions to suppress sneak current in crossbar without raising integration complexity. In this work, memristors based on Cs0.05(MA0.17FA 0.83 0.95 Pb I0.83Br0.173 perovskite film are presented with a high rectification ratio around 514 and an on/off ratio of 1362. The device can continuously operate for 104 cycles and the retention time is over 104 seconds at 85°C. In-depth mechanistic analysis reveals that the resistive-switching behavior originates from the migration of iodide ions, which is accompanied by a high rectification ratio produced by the high barrier at the interface between Au and Cs0.05(MA0.17FA 0. 83 0.95 Pb(I0.83Br0.17 3. The maximum effective array size based on the perovskite memristor is up to 1747 with a read margin (RM) of 10%. We believe that this work can pave a way for the development of perovskites thin films in high-density memristive arrays.

Original languageEnglish
Pages (from-to)2106-2109
Number of pages4
JournalIEEE Electron Device Letters
Volume45
Issue number11
DOIs
Publication statusPublished - 2024

Keywords

  • iodide ions
  • Perovskites memristor
  • self-rectifying

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