Self-Rectifying Resistive Switching Characteristics in CsMAFAPbIBr Perovskite-Based Memristor Device

Jia Cheng Li, Ying Chen Li, Zi Chun Liu, Yuan Xiao Ma*, Ye Liang Wang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Self-rectifying memristors have been attracting attentions to suppress sneak current in crossbar without raising integration complexity. In this work, memristors based on Cs0.05(MA0.17FA0.83)0.95Pb(I0.83Br0.17)3 perovskite film are presented with a high rectification ratio around 514 and an on/off ratio of 1362. The device can continuously operate for 104 cycles and the retention time is over 104 seconds at 85°C. In-depth mechanistic analysis reveals that the resistive-switching behavior originates from the migration of iodide ions, which is accompanied by a high rectification ratio produced by the high barrier at the interface between Au and Cs0.05(MA0.17FA0.83)0.95Pb(I0.83Br0.17)3. The maximum effective array size based on the perovskite memristor is up to 1747 with a read margin (RM) of 10%. We believe that this work can pave a way for the development of perovskites thin films in high-density memristive arrays.

Original languageEnglish
JournalIEEE Transactions on Components, Packaging and Manufacturing Technology
DOIs
Publication statusAccepted/In press - 2024

Keywords

  • iodide ions
  • Perovskites memristor
  • self-rectifying

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