Research on memory effects and recovery algorithm in imaging through scattering layers via speckle correlations

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Imaging through scattering layers plays an important role in the field of optical imaging. Because of its characteristics, we can observe some targets that are invisible or unobservable. Now, it is a simple and effective way to process images of scattering layers by autocorrelation. However, due to the memory effect and the limitation of the acquisition environment, imaging through scattering layers still lacks the ability to accurately detect unknown objects. In this paper, we analyzed the influence of memory effects and actual acquisition environment on speckle correlations imaging. By controlling the various variables of the experimental device and the image processing, different experimental images and restoration results of the images are obtained. The memory effects control the optical thickness of the scattering layer, the size of the target, and the distance from the target to the scattering layer. There must be appropriate experimental parameter settings to meet the memory effect requirements. In addition, the selection of the position of the image acquisition device determines the degree of dispersion of the speckle. Image processing is mainly for the filtering of space domain and frequency domain, and for changes in constraints in Hybrid Input-Output algorithms. Finally, comparing the influence of all the parameters on the final restored image, the reasonable acquisition scheme and image processing scheme for different targets and scattering media can be obtained. It has reference and guiding significance for the application of imaging through scattering layers via speckle correlations.

Original languageEnglish
Title of host publication2019 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Imaging/Spectroscopy and Signal Processing Technology
EditorsGuohai Situ, Xun Cao, Wolfgang Osten
PublisherSPIE
ISBN (Electronic)9781510636545
DOIs
Publication statusPublished - 2020
Event2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology - Beijing, China
Duration: 26 Oct 201928 Oct 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11438
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Country/TerritoryChina
CityBeijing
Period26/10/1928/10/19

Keywords

  • Memory effects
  • Recovery algorithm
  • Scattering layers
  • Speckle correlations

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