Research on Few-Shot Sample Fault Prediction Method for Electric Drive Systems Based on Transfer Learning

Shichen Zhang, Zizhen Qiu*, Lingxiao Zhao, Xin Huang, Fang Wang, Yang Kang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper introduces a method for fault prediction in electric drive systems, specifically designed to address the challenge of few-shot fault sample availability. Utilizing operational data under normal conditions, the method involves the pre-training of a Long Short-Term Memory (LSTM) network model, followed by the augmentation of scarce fault data through time sliding windows. Transfer learning is then applied to adapt the pre-trained model to fault detection tasks. This innovative approach not only significantly enhances the accuracy of fault prediction but also leverages minimal data to achieve high reliability and efficiency in electric drive assemblies. The methodology demonstrates a substantial improvement over traditional fault prediction models, offering a practical solution to the often resource-intensive field of electric drive system maintenance.

Original languageEnglish
Title of host publicationProceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic - TEPEN2024-IWFDP
EditorsTongtong Liu, Fan Zhang, Shiqing Huang, Jingjing Wang, Fengshou Gu
PublisherSpringer Science and Business Media B.V.
Pages285-295
Number of pages11
ISBN (Print)9783031694820
DOIs
Publication statusPublished - 2024
Externally publishedYes
EventTEPEN International Workshop on Fault Diagnostics and Prognostics, TEPEN-IWFDP 2024 - Qingdao, China
Duration: 8 May 202411 May 2024

Publication series

NameMechanisms and Machine Science
Volume169 MMS
ISSN (Print)2211-0984
ISSN (Electronic)2211-0992

Conference

ConferenceTEPEN International Workshop on Fault Diagnostics and Prognostics, TEPEN-IWFDP 2024
Country/TerritoryChina
CityQingdao
Period8/05/2411/05/24

Keywords

  • Electric Drive Systems
  • Few-shot Sample
  • Transfer Learning

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