Research on fault diagnosis of neural network based on bee colony algorithm optimization in gun control system

Yingshun Li, Yongjian Liu, Xiaojian Yi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Aiming at the problems of large subjectivity and inaccurate diagnosis results in the fault diagnosis of tank gun control system, the fault diagnosis method based on improved artificial bee colony is studied. Combined with the improved artificial bee colony algorithm and BP neural network, a BP neural network algorithm based on improved bee colony optimization algorithm is formed and the model of the algorithm is established. And through the use of MATLAB simulation of computer programs, compared with the BP neural network algorithm without optimization, the experiment is summarized. The results show that the system can give fault diagnosis results more accurately, which helps to improve the maintenance efficiency and reliability of the tank gun control system.

Original languageEnglish
Title of host publicationProceedings - 2019 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2019
EditorsChuan Li, Shaohui Zhang, Jianyu Long, Diego Cabrera, Ping Ding
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages153-159
Number of pages7
ISBN (Electronic)9781728101996
DOIs
Publication statusPublished - Aug 2019
Event2019 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2019 - Beijing, China
Duration: 15 Aug 201917 Aug 2019

Publication series

NameProceedings - 2019 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2019

Conference

Conference2019 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2019
Country/TerritoryChina
CityBeijing
Period15/08/1917/08/19

Keywords

  • Artificial bee colony (ABC) algorithm
  • BP neural network
  • Fault diagnosis
  • Gun control system

Fingerprint

Dive into the research topics of 'Research on fault diagnosis of neural network based on bee colony algorithm optimization in gun control system'. Together they form a unique fingerprint.

Cite this