Research on characteristics measurement of infrared defect tester

Ke Jia Zhang; Bi Feng Zhang; Li Min Xiong; Tao Geng Zhou; Jun Chao Zhang; Hai Feng Meng; Chuan Cai; Ying Wei He; Xiao Hui Li; Chang Shi Wang

doi:10.1117/12.2285194

Research on characteristics measurement of infrared defect tester

Ke Jia Zhang^*
, Bi Feng Zhang
, Li Min Xiong
, Tao Geng Zhou
, Jun Chao Zhang
, Hai Feng Meng
, Chuan Cai
, Ying Wei He
, Xiao Hui Li
, Chang Shi Wang

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Based on a testing method of spatial frequency response(SFR), a setup for characteristics measurements of the infrared defect tester,which can also be called electroluminescence tester(EL tester), a machine examining defects of photovoltaic (PV) panel, was built. The influences of focusing plane adjustments and infrared light box arrangements on resolution measurement of EL tester in full field of view were analyzed. For different types of EL testers, portable and fixed, testing methods and procedures were presented. Especially, a novel testing method for portable EL was claimed, which could do the work well without reference background. Based on method claimed and setup built, the resolutions of different types of EL testers were obtained and stable results were achieved. This setup is portable designed to meet online measurements requirements of PV industry.

Original language	English
Title of host publication	AOPC 2017
Subtitle of host publication	Optoelectronics and Micro/Nano-Optics
Editors	Zhiping Zhou, Min Gu, Xiaocong Yuan, Min Qiu
Publisher	SPIE
ISBN (Electronic)	9781510614017
DOIs	https://doi.org/10.1117/12.2285194
Publication status	Published - 2017
Externally published	Yes
Event	Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017 - Beijing, China Duration: 4 Jun 2017 → 6 Jun 2017

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	10460
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017
Country/Territory	China
City	Beijing
Period	4/06/17 → 6/06/17

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Calibration
Infrared camera
Resolution
SFR

Access to Document

10.1117/12.2285194

Cite this

Zhang, K. J., Zhang, B. F., Xiong, L. M., Zhou, T. G., Zhang, J. C., Meng, H. F., Cai, C., He, Y. W., Li, X. H., & Wang, C. S. (2017). Research on characteristics measurement of infrared defect tester. In Z. Zhou, M. Gu, X. Yuan, & M. Qiu (Eds.), AOPC 2017: Optoelectronics and Micro/Nano-Optics Article 104601F (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10460). SPIE. https://doi.org/10.1117/12.2285194

@inproceedings{c5070ceca48a4b31990fe8aaf9cbd03b,

title = "Research on characteristics measurement of infrared defect tester",

abstract = "Based on a testing method of spatial frequency response(SFR), a setup for characteristics measurements of the infrared defect tester,which can also be called electroluminescence tester(EL tester), a machine examining defects of photovoltaic (PV) panel, was built. The influences of focusing plane adjustments and infrared light box arrangements on resolution measurement of EL tester in full field of view were analyzed. For different types of EL testers, portable and fixed, testing methods and procedures were presented. Especially, a novel testing method for portable EL was claimed, which could do the work well without reference background. Based on method claimed and setup built, the resolutions of different types of EL testers were obtained and stable results were achieved. This setup is portable designed to meet online measurements requirements of PV industry.",

keywords = "Calibration, Infrared camera, Resolution, SFR",

author = "Zhang, \{Ke Jia\} and Zhang, \{Bi Feng\} and Xiong, \{Li Min\} and Zhou, \{Tao Geng\} and Zhang, \{Jun Chao\} and Meng, \{Hai Feng\} and Chuan Cai and He, \{Ying Wei\} and Li, \{Xiao Hui\} and Wang, \{Chang Shi\}",

note = "Publisher Copyright: {\textcopyright} 2017 SPIE.; Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017 ; Conference date: 04-06-2017 Through 06-06-2017",

year = "2017",

doi = "10.1117/12.2285194",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Zhiping Zhou and Min Gu and Xiaocong Yuan and Min Qiu",

booktitle = "AOPC 2017",

address = "United States",

}

Zhang, KJ, Zhang, BF, Xiong, LM, Zhou, TG, Zhang, JC, Meng, HF, Cai, C, He, YW, Li, XH & Wang, CS 2017, Research on characteristics measurement of infrared defect tester. in Z Zhou, M Gu, X Yuan & M Qiu (eds), AOPC 2017: Optoelectronics and Micro/Nano-Optics., 104601F, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10460, SPIE, Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017, Beijing, China, 4/06/17. https://doi.org/10.1117/12.2285194

Research on characteristics measurement of infrared defect tester. / Zhang, Ke Jia; Zhang, Bi Feng; Xiong, Li Min et al.
AOPC 2017: Optoelectronics and Micro/Nano-Optics. ed. / Zhiping Zhou; Min Gu; Xiaocong Yuan; Min Qiu. SPIE, 2017. 104601F (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10460).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Research on characteristics measurement of infrared defect tester

AU - Zhang, Ke Jia

AU - Zhang, Bi Feng

AU - Xiong, Li Min

AU - Zhou, Tao Geng

AU - Zhang, Jun Chao

AU - Meng, Hai Feng

AU - Cai, Chuan

AU - He, Ying Wei

AU - Li, Xiao Hui

AU - Wang, Chang Shi

PY - 2017

Y1 - 2017

N2 - Based on a testing method of spatial frequency response(SFR), a setup for characteristics measurements of the infrared defect tester,which can also be called electroluminescence tester(EL tester), a machine examining defects of photovoltaic (PV) panel, was built. The influences of focusing plane adjustments and infrared light box arrangements on resolution measurement of EL tester in full field of view were analyzed. For different types of EL testers, portable and fixed, testing methods and procedures were presented. Especially, a novel testing method for portable EL was claimed, which could do the work well without reference background. Based on method claimed and setup built, the resolutions of different types of EL testers were obtained and stable results were achieved. This setup is portable designed to meet online measurements requirements of PV industry.

AB - Based on a testing method of spatial frequency response(SFR), a setup for characteristics measurements of the infrared defect tester,which can also be called electroluminescence tester(EL tester), a machine examining defects of photovoltaic (PV) panel, was built. The influences of focusing plane adjustments and infrared light box arrangements on resolution measurement of EL tester in full field of view were analyzed. For different types of EL testers, portable and fixed, testing methods and procedures were presented. Especially, a novel testing method for portable EL was claimed, which could do the work well without reference background. Based on method claimed and setup built, the resolutions of different types of EL testers were obtained and stable results were achieved. This setup is portable designed to meet online measurements requirements of PV industry.

KW - Calibration

KW - Infrared camera

KW - Resolution

KW - SFR

UR - https://www.scopus.com/pages/publications/85040514121

U2 - 10.1117/12.2285194

DO - 10.1117/12.2285194

M3 - Conference contribution

AN - SCOPUS:85040514121

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - AOPC 2017

A2 - Zhou, Zhiping

A2 - Gu, Min

A2 - Yuan, Xiaocong

A2 - Qiu, Min

PB - SPIE

T2 - Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017

Y2 - 4 June 2017 through 6 June 2017

ER -

Research on characteristics measurement of infrared defect tester

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

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