Repeatability study of 2D MEMS mirrors based on S-shaped Al/SiO2 bimorphs

Qiao Chen, Hao Zhang, Xiaoyang Zhang, Dacheng Xu, Huikai Xie

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

16 Citations (Scopus)

Abstract

MEMS devices based on bimorphs are affected by several effects including creep, stress, and fracture in bimorph structures. In this paper, we present the reliability study of an S-shaped bimorph MEMS mirror. The following tests are performed: 100 million cycle scanning, vibration, and isothermal holding. Only 0.4% scan angle change was observed after experiencing a 6-axis, 20g vibration. A maximum 0.7% change was measured after the MEMS mirror gone through an isothermal holding for 10 hours at 150°C. After a 100 million cycles of scanning, the maximum drift was less than 0.01°.

Original languageEnglish
Title of host publication8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE NEMS 2013
Pages817-820
Number of pages4
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE NEMS 2013 - Suzhou, China
Duration: 7 Apr 201310 Apr 2013

Publication series

Name8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE NEMS 2013

Conference

Conference8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE NEMS 2013
Country/TerritoryChina
CitySuzhou
Period7/04/1310/04/13

Keywords

  • MEMS mirror
  • bimorph strucure
  • reliability
  • repeatability
  • thermal actuator

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