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Reliability aware simulation flow: From TCAD calibration to circuit level analysis
Razaidi Hussin, Louis Gerrer, Jie Ding, Salvatore Maria Amaroso, Liping Wang, Marco Semicic, Pieter Weckx, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Citations
(Scopus)