Reliability analyses of linear two-dimensional consecutive k-type systems

He Yi; Narayanaswamy Balakrishnan; Xiang Li

doi:10.1017/jpr.2023.51

Reliability analyses of linear two-dimensional consecutive k-type systems

He Yi^*
, Narayanaswamy Balakrishnan^*
, Xiang Li^*

^*Corresponding author for this work

Beijing University of Chemical Technology
McMaster University

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

In this paper, several linear two-dimensional consecutive k-type systems are studied, which include the linear connected-(k, r)-out-of- system and the linear l-connected-(k, r)-out-of- system without/with overlapping. Reliabilities of these systems are studied via the finite Markov chain imbedding approach (FMCIA) in a novel way. Some numerical examples are provided to illustrate the theoretical results established here and also to demonstrate the efficiency of the developed method. Finally, some possible applications and generalizations of the developed results are pointed out.

Original language	English
Pages (from-to)	439-464
Number of pages	26
Journal	Journal of Applied Probability
Volume	61
Issue number	2
DOIs	https://doi.org/10.1017/jpr.2023.51
Publication status	Published - 14 Jun 2024
Externally published	Yes

Keywords

finite Markov chain imbedding approach (FMCIA)
linear two-dimensional consecutive k-type system
non-overlapping
overlapping
Reliability

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10.1017/jpr.2023.51

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title = "Reliability analyses of linear two-dimensional consecutive k-type systems",

abstract = "In this paper, several linear two-dimensional consecutive k-type systems are studied, which include the linear connected-(k, r)-out-of- system and the linear l-connected-(k, r)-out-of- system without/with overlapping. Reliabilities of these systems are studied via the finite Markov chain imbedding approach (FMCIA) in a novel way. Some numerical examples are provided to illustrate the theoretical results established here and also to demonstrate the efficiency of the developed method. Finally, some possible applications and generalizations of the developed results are pointed out.",

keywords = "finite Markov chain imbedding approach (FMCIA), linear two-dimensional consecutive k-type system, non-overlapping, overlapping, Reliability",

author = "He Yi and Narayanaswamy Balakrishnan and Xiang Li",

note = "Publisher Copyright: {\textcopyright} The Author(s), 2023. Published by Cambridge University Press on behalf of Applied Probability Trust.",

year = "2024",

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doi = "10.1017/jpr.2023.51",

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AU - Yi, He

AU - Balakrishnan, Narayanaswamy

AU - Li, Xiang

N1 - Publisher Copyright: © The Author(s), 2023. Published by Cambridge University Press on behalf of Applied Probability Trust.

PY - 2024/6/14

Y1 - 2024/6/14

N2 - In this paper, several linear two-dimensional consecutive k-type systems are studied, which include the linear connected-(k, r)-out-of- system and the linear l-connected-(k, r)-out-of- system without/with overlapping. Reliabilities of these systems are studied via the finite Markov chain imbedding approach (FMCIA) in a novel way. Some numerical examples are provided to illustrate the theoretical results established here and also to demonstrate the efficiency of the developed method. Finally, some possible applications and generalizations of the developed results are pointed out.

AB - In this paper, several linear two-dimensional consecutive k-type systems are studied, which include the linear connected-(k, r)-out-of- system and the linear l-connected-(k, r)-out-of- system without/with overlapping. Reliabilities of these systems are studied via the finite Markov chain imbedding approach (FMCIA) in a novel way. Some numerical examples are provided to illustrate the theoretical results established here and also to demonstrate the efficiency of the developed method. Finally, some possible applications and generalizations of the developed results are pointed out.

KW - finite Markov chain imbedding approach (FMCIA)

KW - linear two-dimensional consecutive k-type system

KW - non-overlapping

KW - overlapping

KW - Reliability

UR - https://www.scopus.com/pages/publications/85169474872

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DO - 10.1017/jpr.2023.51

M3 - Article

AN - SCOPUS:85169474872

SN - 0021-9002

VL - 61

SP - 439

EP - 464

JO - Journal of Applied Probability

JF - Journal of Applied Probability

IS - 2

ER -

Reliability analyses of linear two-dimensional consecutive k-type systems

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Keywords

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