Abstract
In this paper, the relationship between exciton recombination zone and applied voltage in organic light-emitting diodes (OLEDs) ITO/NPB (40 nm)/Alq3(w nm)/rubrene(3 nm)/Alq3(50-w)/Al, in which a 3 nm rubrene as sensing layer is inserted in Alq3 layer at different depth, is studied. By comparing the electroluminescence (EL) spectra of device driven under different applied voltages, a conclusion can be drawn that the recombination zone shifts logarithmically with increasing applied voltages.
| Original language | English |
|---|---|
| Pages (from-to) | 108-111 |
| Number of pages | 4 |
| Journal | Displays |
| Volume | 27 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - Jul 2006 |
| Externally published | Yes |
Keywords
- OLED
- Recombination zone
- Sensing layer
- Ultra-thin layer
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