Refraction angle and edge visibility in X-ray diffraction enhanced imaging

Yu Chen*, Quan Jie Jia, Gang Li, Yu Zhu Wang, Xian Ying Xue, Xiao Ming Jiang, Zhi Hua Chen, Lin Pan, Hong Yan Li

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Diffraction-enhanced X-ray imaging could extract accurately the refraction angles of the sample, which is very important to increase the image contrast of low Z samples. In this paper, the DEI experiments with X-rays of different energies were performed both on wedge-shaped and rounded model samples. Refraction angles of the two samples were all obtained accurately, and the results agreed well with the calculations. Quantitative analyses based on Edge Visibility were performed for the wedge-shaped model sample. The results revealed that the calculated positions for the Best Edge Visibility of the slope with fixed refraction angle were calculable in good agreement with the experimental results. A quantitative research on the Edge Visibility of real tissues sample was carried out and the optimal condition for best contrast of DEI images were discussed.

Original languageEnglish
Pages (from-to)982-989
Number of pages8
JournalKao Neng Wu Li Yu Ho Wu Li/High Energy Physics and Nuclear Physics
Volume31
Issue number10
Publication statusPublished - Oct 2007
Externally publishedYes

Keywords

  • Best edge visibility
  • Diffraction enhanced imaging
  • Edge visibility
  • Refraction angle

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