Quantum-mathematical model of edge and peak point in Fresnel diffraction through a slit

Xiao He Luo, Hui Mei*, Qiu Dong Zhu, Shan Shan Wang, Yin Long Hou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The intensity distribution in Fresnel diffraction through a slit includes numerous small fluctuations referred to as ripples. These ripples make the modelling of the intensity distribution complicated. In this study, we examine the characteristics of the Fresnel diffraction intensity distribution to deduce the rule for the peak position and then propose two types of quantum-mathematical models to obtain the distance between the edge and the peak point. The analysis and simulation indicate that the error in the models is below 0.50 μm. The models can also be used to detect the edges of a diffraction object, and we conduct several experiments to measure the slit width. The experimental results reveal that the repetition accuracy of the method can reach 0.23 μm.

Original languageEnglish
Article number054202
JournalChinese Physics B
Volume26
Issue number5
DOIs
Publication statusPublished - May 2017
Externally publishedYes

Keywords

  • Fresnel diffraction
  • edge
  • peak point
  • slit

Fingerprint

Dive into the research topics of 'Quantum-mathematical model of edge and peak point in Fresnel diffraction through a slit'. Together they form a unique fingerprint.

Cite this