Abstract
Van der Waals ferroelectrics/semiconductor heterostructures such as CuInP2S6 (CIPS)/ MoS2 hold promise for optoelectronics, yet their interfacial mechanisms remain poorly understood. Here, it is shown that type-II band alignment at the CIPS/MoS2 interface not ferroelectric polarization drives high performance. The gate-free devices achieve a photocurrent-to-dark current ratio >104, and a responsivity of 730 A·W−1 under low-intensity visible illumination without pre-poling. Inserting an h-BN spacer to eliminate direct band alignment sharply degrades device performance, confirming its essential role in enabling efficient photocarrier separation. Nanoscale measurements, photoluminescence quenching, bandgap narrowing, and first-principles calculations all consistently support the presence and function of type-II alignment. These results clarify the operating mechanism of CIPS/MoS2 devices and offer guidance for interface engineering in 2D optoelectronic devices.
| Original language | English |
|---|---|
| Article number | e11782 |
| Journal | Small |
| Volume | 22 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 8 Jan 2026 |
| Externally published | Yes |
Keywords
- 2D materials
- MoS/CuInPS heterojunction
- photodetection
- transistors