Probing surface information of alloy by time of flight-secondary ion mass spectrometer

Tinglu Song; Meishuai Zou; Defeng Lu; Hanyuan Chen; Benpeng Wang; Shuo Wang; Fan Xu

doi:10.3390/cryst11121465

Probing surface information of alloy by time of flight-secondary ion mass spectrometer

Tinglu Song, Meishuai Zou^*, Defeng Lu, Hanyuan Chen, Benpeng Wang, Shuo Wang, Fan Xu^*

^*Corresponding author for this work

School of Material Science and Engineering

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.

Original language	English
Article number	1465
Journal	Crystals
Volume	11
Issue number	12
DOIs	https://doi.org/10.3390/cryst11121465
Publication status	Published - Dec 2021

Keywords

2D mapping image
Alloy
Component distribution
Crystal orientation
ToF-SIMS

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10.3390/cryst11121465

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title = "Probing surface information of alloy by time of flight-secondary ion mass spectrometer",

abstract = "In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.",

keywords = "2D mapping image, Alloy, Component distribution, Crystal orientation, ToF-SIMS",

author = "Tinglu Song and Meishuai Zou and Defeng Lu and Hanyuan Chen and Benpeng Wang and Shuo Wang and Fan Xu",

note = "Publisher Copyright: {\textcopyright} 2021 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2021",

month = dec,

doi = "10.3390/cryst11121465",

language = "English",

volume = "11",

journal = "Crystals",

issn = "2073-4352",

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T1 - Probing surface information of alloy by time of flight-secondary ion mass spectrometer

AU - Song, Tinglu

AU - Zou, Meishuai

AU - Lu, Defeng

AU - Chen, Hanyuan

AU - Wang, Benpeng

AU - Wang, Shuo

AU - Xu, Fan

PY - 2021/12

Y1 - 2021/12

N2 - In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.

AB - In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.

KW - 2D mapping image

KW - Alloy

KW - Component distribution

KW - Crystal orientation

KW - ToF-SIMS

UR - https://www.scopus.com/pages/publications/85120159003

U2 - 10.3390/cryst11121465

DO - 10.3390/cryst11121465

M3 - Article

AN - SCOPUS:85120159003

SN - 2073-4352

VL - 11

JO - Crystals

JF - Crystals

IS - 12

M1 - 1465

ER -

Probing surface information of alloy by time of flight-secondary ion mass spectrometer

Abstract

Keywords

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