Prediction of yield stress for polysynthetically twinned TiAl crystals

Jun Yang, Gengkai Hu*, Yonggang Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

An analytical approach based on continuum micromechanics and dislocation theory to predict the yield stress of polysynthetically twinned TiAl crystals was proposed. The detailed domain microstructures of the γ lamellae were taken into account. The results showed that the constant strain assumption in the different variants of the γ phase gives better correlation with the experiment.

Original languageEnglish
Pages (from-to)293-299
Number of pages7
JournalScripta Materialia
Volume45
Issue number3
DOIs
Publication statusPublished - 13 Aug 2001

Keywords

  • Lamellar structure
  • Micromechanics
  • Modelling
  • TiAl
  • Yield stress

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