PI-TSV等效热导率提取与验证

Translated title of the contribution: Extraction and Verification on Equivalent Thermal Conductivity of PI-TSV

Research output: Contribution to journalArticlepeer-review

Abstract

Compared with the traditional T/R modules, the 2.5D integrated silicon-based T/R modules implemented with TSV interposer are smaller, more integrated and possess better heat dissipation. Through-silicon-via (TSV) is one of the key structures. It is difficult to realize the finite element thermal simulation of complicated 2.5D integrated T/R modules, thus a solution which utilizes the equivalent thermal conductivity of TSV was employed to simplify the finite element analysis (finite element analysis, FEA) in this paper. The FEA of TSV with polymide liner (PI-TSV) was carried out and the structural parameters were changed to detect their effects on PI-TSV equivalent thermal conductivity. Finally, the empirical equation of PI-TSV equivalent thermal conductivity with respect to copper pillar diameter, insulation thickness and TSV pitch was presented.

Translated title of the contributionExtraction and Verification on Equivalent Thermal Conductivity of PI-TSV
Original languageChinese (Traditional)
Pages (from-to)1180-1186
Number of pages7
JournalBeijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
Volume39
Issue number11
DOIs
Publication statusPublished - 1 Nov 2019

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