Phase microscopy using the quadriwave lateral shearing interferometer with continuously variable shear ratio

  • Hui Zhong
  • , Yanqiu Li*
  • , Ke Liu*
  • , Xiaotian Zhang
  • , Xiting Han
  • , Tao Wang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Depending on the measured objects and the specific detection requirements, adjusting the shear ratio appropriately is crucial for optimizing the detection performance of quadriwave lateral shearing interferometric microscopy (QWLSIM). Hence, the shear ratio in QWLSIM should be continuously variable in practical applications. In this paper, phase microscopy using the quadriwave lateral shearing interferometer with continuously variable shear ratio is proposed. We use a globally random encoded hybrid grating (GREHG), which comprises an amplitude grating and a phase chessboard, as the beam splitter in the interferometer. The coding rule of GREHG approximates the ideal grating across the entire grating based on the optical flux constraint, effectively suppressing all higher-order diffraction orders except the necessary ±1 diffraction orders and pixel light, thus achieving a continuously variable shear ratio. As the pixel count of the grating period increases, the adjustment of the shear ratio approaches the ideal condition of continuous adjustment more closely. Simulation and experimental results demonstrate that this approach realizes continuously variable shear ratio without modifying the system, which is of great significance for QWLSIM with diverse measurement requirements.

Original languageEnglish
Title of host publicationAOPC 2024
Subtitle of host publicationComputational Imaging Technology
EditorsPing Su
PublisherSPIE
ISBN (Electronic)9781510687912
DOIs
Publication statusPublished - 2024
Externally publishedYes
Event2024 Applied Optics and Photonics China: Computational Imaging Technology, AOPC 2024 - Beijing, China
Duration: 23 Jul 202426 Jul 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13501
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2024 Applied Optics and Photonics China: Computational Imaging Technology, AOPC 2024
Country/TerritoryChina
CityBeijing
Period23/07/2426/07/24

Keywords

  • Microscopy
  • diffraction grating
  • phase imaging
  • quadriwave lateral shearing interferometer

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