Parameterized Backscattering Modeling of Multilayer Thin-Coated Targets

To improve the efficiency of backscattering modeling for electrically large targets with multilayer thin coatings, this paper presents a parameterized method based on the attribute scattering center (ASC) model. By matching the phase delay, the multilayer dielectric structure is equivalently represented as a single uniform layer. The generalized reflection coefficient of this equivalent layer over a PEC substrate is derived using a ray-based approach and incorporated into the ASC model to correct its amplitude and phase characteristics. Simulation results confirm that the proposed model achieves high accuracy while significantly improving modeling efficiency, making it suitable for rapid electromagnetic characterization of complex coated targets.