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Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System

  • Meijing Gao*
  • , Ailing Tan
  • , Jie Xu
  • , Weiqi Jin
  • , Zhenlong Zu
  • , Ming Yang
  • *Corresponding author for this work
  • Yanshan University
  • Beijing Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.

Original languageEnglish
Pages (from-to)65-73
Number of pages9
JournalJournal of Beijing Institute of Technology (English Edition)
Volume27
Issue number1
DOIs
Publication statusPublished - 1 Mar 2018
Externally publishedYes

Keywords

  • Optical microscanning
  • Oversample reconstruction
  • Strong inter-diagonal matrix
  • Thermal microscope imaging system

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