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Optimal Bayesian reliability assurance test plan for degraded products based on Wiener process

  • Xiaoliang Ling
  • , Aizhi Ren
  • , Liying Wang
  • , Qingan Qiu*
  • *Corresponding author for this work
  • College of Sciences
  • Hebei University of Science and Technology
  • Department of Mathematics and Physics
  • Shijiazhuang Tiedao University
  • Beijing Institute of Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Reliability assurance tests have been widely adopted to determine whether products meet a specified reliability level under a prescribed confidence level. However, for highly reliable products, insufficient failure data are often observed during assurance testing. To address this issue, this paper proposes an optimal reliability assurance test plan for degraded products using a Wiener process, accounting for unit heterogeneity and measurement error. Single and double sampling plans are constructed, with posterior producer’s and consumer’s risks defined in a Bayesian framework. Two optimization models are proposed: one minimizes the sample size or average sample number under posterior risk constraints, and the other minimizes the expected cost associated with decision uncertainty and subsequent reliability assurance activities. In addition, a dynamic strategy for adjusting the nonconforming threshold over time is investigated. Numerical analyses are conducted to compare the single and double sampling plans and to examine how reliability requirements, risk constraints, and test conditions affect the optimal designs. A case study further demonstrates the effectiveness and applicability of the proposed method.

Original languageEnglish
Article number113372
JournalReliability Engineering and System Safety
Volume277
DOIs
Publication statusPublished - Jan 2027
Externally publishedYes

Keywords

  • Bayesian posterior risk
  • Expected cost
  • Reliability assurance test
  • Sampling plan optimization
  • Wiener process

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