TY - GEN
T1 - Optical surface measurement based on reverse Hartmann test using coaxial illumination
AU - Luo, Yawen
AU - Wang, Shanshan
AU - Liu, Xin
AU - Zhang, Nansheng
AU - Gao, Qing
AU - Hao, Qun
N1 - Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
PY - 2026/1/13
Y1 - 2026/1/13
N2 - Interferometry with high measurement accuracy is a universal method for optical mirror surface measurement, but its dynamic range is small. When local slope gradients on the test surface excess a critical threshold, interferometers capture excessively dense fringe patterns that preclude reliable phase unwrapping. In contrast, reverse Hartmann test, as a geometric measurement approach, delivers comparable theoretical accuracy to interferometry while exhibiting greater dynamic range. We propose integrating the reverse Hartmann illumination module into the Fizeau interferometer optical path. This system compensates for interferometry's measurement gaps in high-gradient surface measurement without employing compensating optics. Leveraging the null-test configuration inherent to Fizeau interferometers, a beam splitter establishes a coaxial configuration among the display, detector, and test mirror, facilitating precise geometric parameter calibration. Based on the theoretical model, an actual measurement system was built. The large dynamic range and high precision of the proposed coaxial surface measurement system are verified by quantitative comparative experiments with the interferometry. By axially displacing the test mirror, controlled surface errors were introduced. The experimental results show that proposed coaxial surface measurement system's dynamic range far exceeds interferometry, with 9.31μm root mean square (RMS) accuracy. The integration of proposed coaxial measurement path with interferometric path promises a compact, large dynamic range, and high accuracy surface measurement system, advancing cost-effective precision optics manufacturing.
AB - Interferometry with high measurement accuracy is a universal method for optical mirror surface measurement, but its dynamic range is small. When local slope gradients on the test surface excess a critical threshold, interferometers capture excessively dense fringe patterns that preclude reliable phase unwrapping. In contrast, reverse Hartmann test, as a geometric measurement approach, delivers comparable theoretical accuracy to interferometry while exhibiting greater dynamic range. We propose integrating the reverse Hartmann illumination module into the Fizeau interferometer optical path. This system compensates for interferometry's measurement gaps in high-gradient surface measurement without employing compensating optics. Leveraging the null-test configuration inherent to Fizeau interferometers, a beam splitter establishes a coaxial configuration among the display, detector, and test mirror, facilitating precise geometric parameter calibration. Based on the theoretical model, an actual measurement system was built. The large dynamic range and high precision of the proposed coaxial surface measurement system are verified by quantitative comparative experiments with the interferometry. By axially displacing the test mirror, controlled surface errors were introduced. The experimental results show that proposed coaxial surface measurement system's dynamic range far exceeds interferometry, with 9.31μm root mean square (RMS) accuracy. The integration of proposed coaxial measurement path with interferometric path promises a compact, large dynamic range, and high accuracy surface measurement system, advancing cost-effective precision optics manufacturing.
KW - Aspherical surface measurement
KW - coaxial illumination
KW - reverse Hartmann test
UR - https://www.scopus.com/pages/publications/105028951782
U2 - 10.1117/12.3091093
DO - 10.1117/12.3091093
M3 - Conference contribution
AN - SCOPUS:105028951782
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 11th International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2025
A2 - Luo, Xiangang
A2 - Fotakis, Costas
A2 - Sugioka, Koji
A2 - Teng, Jinghua
PB - SPIE
T2 - 11th International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2025
Y2 - 20 July 2025 through 22 July 2025
ER -